{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00219200","sets":["6164:6165:7651:10964"]},"path":["10964"],"owner":"44499","recid":"219200","title":["電源TSV検査のための抵抗測定箇所最適化アルゴリズムの比較"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-08-24"},"_buckets":{"deposit":"eada6ef9-f811-45ee-ba70-58950ea6d29f"},"_deposit":{"id":"219200","pid":{"type":"depid","value":"219200","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"電源TSV検査のための抵抗測定箇所最適化アルゴリズムの比較","author_link":["571527","571525","571526","571524"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電源TSV検査のための抵抗測定箇所最適化アルゴリズムの比較"},{"subitem_title":"Comparison of Measurement Point Selection Algorithms for Testing Power TSV in 3D-IC","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ポスター","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2022-08-24","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"帝京平成大学"},{"subitem_text_value":"帝京平成大学"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Teikyo Heisei University","subitem_text_language":"en"},{"subitem_text_value":"Teikyo Heisei University","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/219200/files/IPSJ-DAS2022028.pdf","label":"IPSJ-DAS2022028.pdf"},"date":[{"dateType":"Available","dateValue":"2024-08-24"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-DAS2022028.pdf","filesize":[{"value":"1.4 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"c909bab8-c59f-4182-b01b-e8aae7c34d57","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"藤本, 耕太"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"蜂屋, 孝太郎"}],"nameIdentifiers":[{}]}]},"item_18_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kouta, Fujimoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Koutaro, Hachiya","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"3D-IC における電源 TSV (Through Silicon Via) のオープン故障を検出するために TSV 直下のパッド間抵抗を測定する際，診断性能が最大となる測定箇所を選択する．従来は，しらみつぶし法により真の最適解を求めたり，山登り法により近似解を求めたりしていた．本発表では，近傍しらみつぶし法を提案し，解や実行時間を従来法と比較する．山登り法では最適解と比べ診断性能 RMD が 2.4% 程度以下の低下がみられたが，しらみつぶし法に比べ約 11 倍の高速化が得られた．今回提案する近傍しらみつぶし法では全体の4%程度を除き最適解が得られ（RMD 誤差 0.3% 以下），しらみつぶし法に比べ約 9.7 倍の高速化が得られた．","subitem_description_type":"Other"}]},"item_18_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"When measuring the resistance between pads directly under the power TSVs (Through Silicon Vias) in a 3D-IC to detect their open failures, the measurement point selection is crucial for maximizing diagnostic performance. In the previous papers, Exhaustive Search is applied to get the optimal solution, or alternatively Hill Climbing is applied to get the near optimal solution. In this paper, we propose Neighborhood Exhaustive Search and compare its solution and execution time with the conventional search methods. Hill Climbing shows a decrease in diagnostic performance RMD of about 2.4% or less compared to the optimal solution, but it was about 11 times faster than the Exhaustive Search. The proposed Neighborhood Exhaustive Search derives the optimal solutions in most of the cases (RMD error is less than 0.3%), and the speed is about 9.7 times faster than Exhaustive Search.","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"166","bibliographic_titles":[{"bibliographic_title":"DAシンポジウム2022論文集"}],"bibliographicPageStart":"162","bibliographicIssueDates":{"bibliographicIssueDate":"2022-08-24","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"2022"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":219200,"updated":"2025-01-19T14:53:24.518755+00:00","links":{},"created":"2025-01-19T01:19:31.252449+00:00"}