{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00219182","sets":["6164:6165:7651:10964"]},"path":["10964"],"owner":"44499","recid":"219182","title":["集積回路より漏えいする電磁波の電源電圧依存性モデル"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-08-24"},"_buckets":{"deposit":"7d28ecdf-367d-4a7f-afd3-91646eb48d86"},"_deposit":{"id":"219182","pid":{"type":"depid","value":"219182","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"集積回路より漏えいする電磁波の電源電圧依存性モデル","author_link":["571439","571437","571438","571440"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"集積回路より漏えいする電磁波の電源電圧依存性モデル"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"セキュリティ","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2022-08-24","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪大学大学院情報科学研究科"},{"subitem_text_value":"大阪大学大学院情報科学研究科"},{"subitem_text_value":"大阪大学大学院情報科学研究科"},{"subitem_text_value":"大阪大学大学院情報科学研究科"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/219182/files/IPSJ-DAS2022010.pdf","label":"IPSJ-DAS2022010.pdf"},"date":[{"dateType":"Available","dateValue":"2024-08-24"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-DAS2022010.pdf","filesize":[{"value":"2.8 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"722d93a1-f576-41a5-b3f3-f30fc90a7711","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"南口, 和生"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"御堂, 義博"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三浦, 典之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"塩見, 準"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"本稿では，集積回路より漏えいする電磁波の電源電圧依存性モデルを提案する．提案モデルは CMOS 回路の動作速度と電源電圧からなる閉形式関数であり，低電圧動作する集積回路の動作性能と耐タンパ性の依存関係を表現する．トランジスタレベル回路シミュレーションおよび実測においてモデルの検証を行った後，モデルに基づき低電圧回路の耐タンパ設計手法を提案する．","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"63","bibliographic_titles":[{"bibliographic_title":"DAシンポジウム2022論文集"}],"bibliographicPageStart":"58","bibliographicIssueDates":{"bibliographicIssueDate":"2022-08-24","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"2022"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":219182,"updated":"2025-01-19T14:53:47.987110+00:00","links":{},"created":"2025-01-19T01:19:30.233974+00:00"}