{"created":"2025-01-19T01:19:19.986662+00:00","updated":"2025-01-19T14:57:42.237140+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00218993","sets":["1164:1579:10818:10973"]},"path":["10973"],"owner":"44499","recid":"218993","title":["フィールドテストのためのｋ連続状態遷移に基づく状態信号系列を用いたフィールドテスタビリティの評価"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-07-20"},"_buckets":{"deposit":"7fe7114b-960d-4211-8a5d-6aeb5bb2ffda"},"_deposit":{"id":"218993","pid":{"type":"depid","value":"218993","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"フィールドテストのためのｋ連続状態遷移に基づく状態信号系列を用いたフィールドテスタビリティの評価","author_link":["570620","570619","570624","570621","570617","570618","570622","570623"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"フィールドテストのためのｋ連続状態遷移に基づく状態信号系列を用いたフィールドテスタビリティの評価"},{"subitem_title":"An Evaluation of Field Testability Using States Signal Sequences Based on k-Consecutive State Transitions for Field Testing","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト高速化・効率化","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2022-07-20","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"日本大学生産工学部"},{"subitem_text_value":"日本大学生産工学部"},{"subitem_text_value":"京都産業大学情報理工学部"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Industrial Technology, Nihon University","subitem_text_language":"en"},{"subitem_text_value":"College of Industrial Technology, Nihon University","subitem_text_language":"en"},{"subitem_text_value":"College of Industrial Technology, Nihon University","subitem_text_language":"en"},{"subitem_text_value":"Faculty of Information Science and Engineering, Kyoto Sangyo University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/218993/files/IPSJ-ARC22249004.pdf","label":"IPSJ-ARC22249004.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-ARC22249004.pdf","filesize":[{"value":"1.7 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"16"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"7d2bd1b0-dbd6-4b9f-9341-436ef7474124","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"豊岡, 雄大"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"渡辺, 悠樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"細川, 利典"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"吉村, 正義"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yudai, Toyooka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yuki, Watanabe","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toshinori, Hosokawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masayoshi, Yoshimura","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10096105","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8574","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ミッションクリティカルなシステムに搭載されている VLSI は経年劣化による欠陥を検出するために，フィールドテストが必要とされている．しかしながら，電源オン／オフ時間のような短い時間に回路を網羅的にテストすることは困難な問題である．その問題を解決するためにコントローラ中のすべての状態遷移を n 回実行する状態信号系列を用いた非スキャンベースの組込み自己テスト手法が提案されている．しかしながら，その故障検出率は十分に高いわけではない．本論文では，コントローラ中のすべての k 連続状態遷移を n 回実行する状態信号系列生成手法を提案する．また提案した状態信号系列から生成される制御信号系列とレジスタ転送レベルでのデータパスの構造を用いた構造的記号シミュレーションを提案する．構造的記号シミュレーションを用いてデータパス中のハードウェア要素のテスト可能率と各ハードウェア要素のテスト実行回数を評価し，故障検出率とテスト可能率の関係を解析する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"For VLSIs which are built in mission-critical systems field testing is required to detect defects caused by aging. However, it is a difficult problem to comprehensively test circuits in a short time such as time for power on / off. To solve this problem, a non-scan based built-in self test method using a status signal sequence which executes all state transitions in controllers n times has been proposed. However, the fault coverage is not high enough. In this paper, we propose a generation method of status signal sequences which execute all k continuous state transitions in controllers n times. We also propose structural symbolic simulation using control signal sequences generated from the status signal sequences and the structure of data-paths at register transfer level. We evaluate the testability ratio for hardware elements in data-paths and the number of test executions of each hardware element using structural symbolic simulation and analyze the relationship with the fault coverage and the testability ratio.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システム・アーキテクチャ（ARC）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2022-07-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicVolumeNumber":"2022-ARC-249"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":218993,"links":{}}