{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00218990","sets":["1164:1579:10818:10973"]},"path":["10973"],"owner":"44499","recid":"218990","title":["擬似ブール最適化を用いたFFR出力信号線遷移とWSAの相関に基づく低消費電力指向ドントケア割当て法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-07-20"},"_buckets":{"deposit":"58fb7187-fa3a-4704-aca4-c8359e4deeff"},"_deposit":{"id":"218990","pid":{"type":"depid","value":"218990","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"擬似ブール最適化を用いたFFR出力信号線遷移とWSAの相関に基づく低消費電力指向ドントケア割当て法","author_link":["570595","570601","570596","570598","570597","570600","570602","570599"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"擬似ブール最適化を用いたFFR出力信号線遷移とWSAの相関に基づく低消費電力指向ドントケア割当て法"},{"subitem_title":"A Don’t Care Filling Method for Low Power Consumption Based On Correlation Between Transition on FFR output and WSA Using Pseudo-Boolean Optimization","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"低消費電力テスト","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2022-07-20","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"京都産業大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Nihon University","subitem_text_language":"en"},{"subitem_text_value":"Nihon University","subitem_text_language":"en"},{"subitem_text_value":"Nihon University","subitem_text_language":"en"},{"subitem_text_value":"Kyoto Sangyo University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/218990/files/IPSJ-ARC22249001.pdf","label":"IPSJ-ARC22249001.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-ARC22249001.pdf","filesize":[{"value":"1.6 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"16"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"1674391b-cfb5-44e8-a649-98335aaae686","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"徐, 雁レイ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三浦, 怜"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"細川, 利典"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"吉村, 正義"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yanling, Xu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Rei, Miura","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toshinori, Hosokawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masayosi, Yoshimura","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10096105","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8574","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年，VLSI の低消費電力化に伴い，低消費電力テストを実行するために，低消費電力指向ドントケア判定手法とドントケア割当て手法が数多く提案されている．その結果，初期テスト集合を変更して生成したテスト集合中のキャプチャアンセーフテストベクトル数を劇的に削減することができた．しかしながら，いくつかの回路に対しては，キャプチャアンセーフテストベクトルが，そのテスト集合中に残る．本論文では，疑似ブール最適化を用いたドントケア割当て手法を提案する．ISCAS’89 ベンチマーク回路と ITC’99 ベンチマーク回路に対する実験結果は，提案したドントケア割当て手法が生成したテスト集合中のキャプチャアンセーフ故障数が 0 であったことを示す．また疑似ブール最適化を用いたドントケア割当て法を高速化するために，ファンアウトフリー領域の出力信号線の遷移と WSA の相関を用いたドントケア判定手法を提案する．その実験結果は相関を用いたドントケア割当て法が平均テスト集合中の 92% のキャプチャセーフテストベクトルに変更することができ，PBO を用いたドントケア割当て手法と比較して，処理時間を平均 20% 削減することができたことを示す．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In recent years, with the low power design of VLSIs, many low power oriented don't care (X) identification methods and X-filling methods have been proposed to perform low power testing. As a result, the number of capture-unsafe test vectors in the test set generated by modifying the initial test set was drastically reduced. However, for some circuits, capture-unsafe test vectors remain in the modified test set. In this paper, we propose an X-filling method using pseudo-Boolean optimization. The experimental results for the ISCAS'89 benchmark circuits and ITC'99 benchmark circuits show that the number of capture-unsafe test vectors in the test set modified by the proposed X-filling method was 0. In addition, to accelerate the time of the X-filling method, we also propose an X-filling method using the correlation between the transition on the output signal lines of fanout-free regions and WSA. The experimental results show that the X-filling method using the correlation could modify 92% test vectors in initial test sets to capture-safe test vectors on average, and reduce the CPU time by 20% on average compared to the X-filling method using PBO.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システム・アーキテクチャ（ARC）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2022-07-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicVolumeNumber":"2022-ARC-249"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":218990,"updated":"2025-01-19T14:57:45.431487+00:00","links":{},"created":"2025-01-19T01:19:19.817786+00:00"}