{"created":"2025-01-19T01:19:11.817116+00:00","updated":"2025-01-19T15:00:38.750210+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00218852","sets":["1164:6389:10832:10943"]},"path":["10943"],"owner":"44499","recid":"218852","title":["電磁リレーへの静磁界攻撃とその対策に関する検討"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-07-12"},"_buckets":{"deposit":"4a5cdf4d-49fb-43cf-8d2a-28828376c43b"},"_deposit":{"id":"218852","pid":{"type":"depid","value":"218852","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"電磁リレーへの静磁界攻撃とその対策に関する検討","author_link":["570075","570078","570076","570079","570074","570077"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電磁リレーへの静磁界攻撃とその対策に関する検討"},{"subitem_title":"Security Assessment and Countermeasures for Magnetic Malfunction of Electromagnetic Relays","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"HWS","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2022-07-12","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"横浜国立大学"},{"subitem_text_value":"横浜国立大学"},{"subitem_text_value":"横浜国立大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"YOKOHAMA National University","subitem_text_language":"en"},{"subitem_text_value":"YOKOHAMA National University","subitem_text_language":"en"},{"subitem_text_value":"YOKOHAMA National University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/218852/files/IPSJ-SPT22048008.pdf","label":"IPSJ-SPT22048008.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SPT22048008.pdf","filesize":[{"value":"1.9 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"46"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"55c815c1-0d4a-4864-83b2-eaead6f35693","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"大和田, 拓実"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"橘, 樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松本, 勉"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takumi, Owada","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kazuki, Tachibana","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsutomu, Matsumoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12628305","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8671","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"スイッチやセンサをはじめとして多くの電気・電子機器にリレーが用いられている．リレーには電磁石によって接点を操作して回路の開閉を切り替える電磁リレーがある．電磁リレーに対して強力な磁界を与えることで接点を不正に接続し，システムを不正に操作する攻撃が考えられる．この種の攻撃は大きな脅威となる可能性があるにもかかわらず，これまで磁界による意図的な誤作動をセキュリティの観点から取り扱った事例は，ほとんど明示されていなかった．そこで本報告では，強力な磁石の利用により電磁リレーの誤作動が，リレーを含む機器の外部からでも起こり得ることを明確に示し，電磁リレーに対する静磁界を用いた攻撃とその対策につき考察する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Relays are used in many electrical and electronic devices, including switches and sensors. Some relays are electromagnetic relays, which switch circuits open and closed by operating the contacts with electromagnets. An attacker could illegally connect the contacts by applying a strong magnetic field to the electromagnetic relay and manipulate the system. Although this type of attack has the potential to pose a significant threat, there have been no explicit examples of intentional malfunctions caused by magnetostatic fields from a security perspective. In this report, we show clearly that electromagnetic relay malfunctions can be caused by the use of strong magnets even from outside the equipment containing the relay, and discuss attacks using static magnetic fields on electromagnetic relays and countermeasures against them.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告セキュリティ心理学とトラスト（SPT）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2022-07-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"8","bibliographicVolumeNumber":"2022-SPT-48"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":218852,"links":{}}