{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00218575","sets":["1164:2735:10865:10962"]},"path":["10962"],"owner":"44499","recid":"218575","title":["Adversarial Attacks and Defenses for Non-Parametric Two-Sample Tests"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-06-20"},"_buckets":{"deposit":"521a8bbd-6beb-496d-9b8a-df87e9aa1c1c"},"_deposit":{"id":"218575","pid":{"type":"depid","value":"218575","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"Adversarial Attacks and Defenses for Non-Parametric Two-Sample Tests","author_link":["568787","568788","568780","568789","568786","568782","568781","568783","568784","568785"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Adversarial Attacks and Defenses for Non-Parametric Two-Sample Tests"},{"subitem_title":"Adversarial Attacks and Defenses for Non-Parametric Two-Sample Tests","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2022-06-20","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"School of Computing, National University of Singapore"},{"subitem_text_value":"RIKEN Center for Advanced Intelligence"},{"subitem_text_value":"DeSI Lab, AAII, University of Technology Sydney\nProject (AIP)"},{"subitem_text_value":"RIKEN Center for Advanced Intelligence/Graduate School of Frontier Sciences, The University of Tokyo"},{"subitem_text_value":"School of Computing, National University of Singapore"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"School of Computing, National University of Singapore","subitem_text_language":"en"},{"subitem_text_value":"RIKEN Center for Advanced Intelligence","subitem_text_language":"en"},{"subitem_text_value":"DeSI Lab, AAII, University of Technology Sydney\nProject (AIP)","subitem_text_language":"en"},{"subitem_text_value":"RIKEN Center for Advanced Intelligence/Graduate School of Frontier Sciences, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"School of Computing, National University of Singapore","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/218575/files/IPSJ-MPS22138005.pdf","label":"IPSJ-MPS22138005.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-MPS22138005.pdf","filesize":[{"value":"3.0 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"17"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"9f45a7dd-eb32-4924-ad34-709aba36eac9","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Xilie, Xu"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Jingfeng, Zhang"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Feng, Liu"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masashi, Sugiyama"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mohan, Kankanhalli"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Xilie, Xu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Jingfeng, Zhang","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Feng, Liu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masashi, Sugiyama","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Mohan, Kankanhalli","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10505667","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8833","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"Non-parametric two-sample tests (TSTs) that judge whether two sets of samples are drawn from the same distribution, have been widely used in the analysis of critical data. People tend to employ TSTs as trusted basic tools and rarely have any doubt about their reliability. This paper systematically uncovers the failure mode of non-parametric TSTs through adversarial attacks and then proposes corresponding defense strategies. First, we theoretically show that an adversary can upperbound the distributional shift which guarantees the attack’s invisibility. Furthermore, we theoretically find that the adversary can also degrade the lower bound of a TST’s test power, which enables us to iteratively minimize the test criterion in order to search for adversarial pairs. To enable TST-agnostic attacks, we propose an ensemble attack (EA) framework that jointly minimizes the different types of test criteria. Second, to robustify TSTs, we propose a max-min optimization that iteratively generates adversarial pairs to train the deep kernels. Extensive experiments on both simulated and real-world datasets validate the adversarial vulnerabilities of non-parametric TSTs and the effectiveness of our proposed defense.","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Non-parametric two-sample tests (TSTs) that judge whether two sets of samples are drawn from the same distribution, have been widely used in the analysis of critical data. People tend to employ TSTs as trusted basic tools and rarely have any doubt about their reliability. This paper systematically uncovers the failure mode of non-parametric TSTs through adversarial attacks and then proposes corresponding defense strategies. First, we theoretically show that an adversary can upperbound the distributional shift which guarantees the attack’s invisibility. Furthermore, we theoretically find that the adversary can also degrade the lower bound of a TST’s test power, which enables us to iteratively minimize the test criterion in order to search for adversarial pairs. To enable TST-agnostic attacks, we propose an ensemble attack (EA) framework that jointly minimizes the different types of test criteria. Second, to robustify TSTs, we propose a max-min optimization that iteratively generates adversarial pairs to train the deep kernels. Extensive experiments on both simulated and real-world datasets validate the adversarial vulnerabilities of non-parametric TSTs and the effectiveness of our proposed defense.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"27","bibliographic_titles":[{"bibliographic_title":"研究報告数理モデル化と問題解決(MPS)"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2022-06-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"5","bibliographicVolumeNumber":"2022-MPS-138"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":218575,"updated":"2025-01-19T15:07:18.518540+00:00","links":{},"created":"2025-01-19T01:18:55.870117+00:00"}