{"id":218207,"updated":"2025-01-19T15:13:55.635811+00:00","links":{},"created":"2025-01-19T01:18:37.118891+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00218207","sets":["934:6391:10778:10915"]},"path":["10915"],"owner":"44499","recid":"218207","title":["組込みシステム向け障害解析環境の効率改善"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-05-31"},"_buckets":{"deposit":"c5612c0c-d908-481b-aedc-5d3a585dd86c"},"_deposit":{"id":"218207","pid":{"type":"depid","value":"218207","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"組込みシステム向け障害解析環境の効率改善","author_link":["566900","566899","566898","566901","566896","566895","566903","566904","566902","566897"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"組込みシステム向け障害解析環境の効率改善"},{"subitem_title":"Improving the Efficiency of Failure Analysis Environment for Embedded Systems","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"[コンシューマ・システム論文] 障害解析，デバッグ，組込みシステム，トレース","subitem_subject_scheme":"Other"}]},"item_type_id":"3","publish_date":"2022-05-31","item_3_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"株式会社日立製作所研究開発グループ／国立大学法人電気通信大学大学院情報システム学研究科"},{"subitem_text_value":"株式会社日立製作所研究開発グループ"},{"subitem_text_value":"早稲田大学理工学術院総合研究所"},{"subitem_text_value":"国立大学法人電気通信大学大学院情報理工学研究科"},{"subitem_text_value":"国立大学法人電気通信大学大学院情報理工学研究科"}]},"item_3_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Hitachi Ltd., Research & Development Group / Graduate School of Information Systems, The University of Electro-Communications","subitem_text_language":"en"},{"subitem_text_value":"Hitachi Ltd., Research & Development Group","subitem_text_language":"en"},{"subitem_text_value":"Research Institute for Science and Engineering, Waseda University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Informatics and Engineering, The University of Electro-Communications","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Informatics and Engineering, The University of Electro-Communications","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/218207/files/IPSJ-TCDS1202004.pdf","label":"IPSJ-TCDS1202004.pdf"},"date":[{"dateType":"Available","dateValue":"2024-05-31"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-TCDS1202004.pdf","filesize":[{"value":"2.5 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"47"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"32d47fda-fef9-4c92-a4c2-b0dd83aea197","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Information Processing Society of Japan"}]},"item_3_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"長野, 岳彦"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小口, 琢夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"吉岡, 信和"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"田原, 康之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"大須賀, 昭彦"}],"nameIdentifiers":[{}]}]},"item_3_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takehiko, Nagano","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takuo, Koguchi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nobukazu, Yoshioka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yasuyuki, Tahara","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Akihiko, Ohsuga","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_3_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12628043","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_3_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2186-5728","subitem_source_identifier_type":"ISSN"}]},"item_3_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"デジタルテレビや携帯電話，カーナビゲーションシステムに代表される組込みシステムの高機能化・複雑化が進み，開発工数が増加している．一方でメーカ間のシェア競争は激化し，開発コストの削減が望まれている．組込みシステムの障害は，ハードウェアとソフトウェアが複数組み合わさって発生する．そのためタイミングに依存し，再現性が低く障害解析に必要な情報をとるために時間がかかるといった問題や，システム全体を解析対象とするため，トレース結果の解析に時間がかかるといった問題を抱えている．そこで我々は，上記問題を解決するための障害解析環境を提案する．提案環境は再現性の低い障害の解析情報を確実に取得するための長時間トレース機能と，トレース結果の解析効率化を狙うボトルネック解析機能，解析情報理解容易化機能の3機能からなる．この障害解析環境はデジタルビデオカメラの開発から順次6製品に適用され，現在も一部製品開発に適用されている．また，一例としてトレース容量を10MBから190GBへ増加し，障害解析日数を6.09日削減する結果を得た．これらの結果について報告する．","subitem_description_type":"Other"}]},"item_3_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Embedded systems work with a combination of hardware and software. Therefore, the occurrence of a failure depends on the timing, and the reproducibility is low. As a result, there is a problem that it takes time to obtain the information necessary for failure analysis. In addition, the entire system will be analyzed. Thus, there is a problem that it takes time to analyze the trace result. Consequently, we propose a failure analysis environment consisting of three functions to solve the above problem. They have the following three functions. 1) The proposed environment has a long-time trace function to reliably acquire analysis information of failures with low reproducibility. 2) Bottleneck analysis function that aims to improve the analysis efficiency of trace results, 3) Function that facilitates understanding of analysis information. This failure analysis environment has been applied to six products in sequence from the development of the digital video camera series. And above environment is still being applied to some product development. Also, as an example, the trace capacity was increased from 10MB to 190GB, and the failure analysis time was reduced by 6.09 days. We report these results.","subitem_description_type":"Other"}]},"item_3_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"37","bibliographic_titles":[{"bibliographic_title":"情報処理学会論文誌コンシューマ・デバイス＆システム（CDS）"}],"bibliographicPageStart":"27","bibliographicIssueDates":{"bibliographicIssueDate":"2022-05-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicVolumeNumber":"12"}]},"relation_version_is_last":true,"weko_creator_id":"44499"}}