{"id":217179,"updated":"2025-01-19T15:35:38.633732+00:00","links":{},"created":"2025-01-19T01:17:41.048804+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00217179","sets":["1164:2036:10820:10893"]},"path":["10893"],"owner":"44499","recid":"217179","title":["故障活性化率に基づく診断分解能向上指向テスト生成法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-03-03"},"_buckets":{"deposit":"64fdd04a-eff4-46d3-a1fd-79add486f2d2"},"_deposit":{"id":"217179","pid":{"type":"depid","value":"217179","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"故障活性化率に基づく診断分解能向上指向テスト生成法","author_link":["562178","562179","562180","562182","562183","562181"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"故障活性化率に基づく診断分解能向上指向テスト生成法"},{"subitem_title":"A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"高信頼性技術","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2022-03-03","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"日本大学生産工学部"},{"subitem_text_value":"明治大学情報コミュニケーション学部"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Industrial Technology Nihon University","subitem_text_language":"en"},{"subitem_text_value":"College of Industrial Technology Nihon University","subitem_text_language":"en"},{"subitem_text_value":"School of Information and Communication Meji University ","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/217179/files/IPSJ-SLDM22198025.pdf","label":"IPSJ-SLDM22198025.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM22198025.pdf","filesize":[{"value":"2.1 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"5ef16fce-939c-4492-849a-a148edf4f646","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"千田, 祐弥"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"細川, 利典"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"山崎, 浩二"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yuya, Chida","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toshinori, Hosokawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Koji, Yamazaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"高い欠陥検出率を達成するテスト生成法の１つとして，n 回検出テスト生成法が提案されている．さらに，テスト品質尺度として故障活性化率が提案され，故障活性化率を向上させるために故障箇所からできるだけ多数の信号線を伝搬するような n 回検出テスト生成が提案された．その実験結果より，故障活性化率の高いテスト集合は様々な故障モデルにおいて高い故障検出率を達成することが示されている．しかしながら，その故障活性化 率に基づくテスト生成手法において，故障伝搬経路の選択に用いている各故障に対するパスグラフは故障箇所から到達可能な外部出力までの未活性化パスセグメント数を保持しているため，必要メモリが膨大になり大規模回路へ の適用が困難であるという問題がある．本論文では，故障伝搬経路の選択に必要なメモリを削減し，大規模回路に 適用可能な故障活性化率に基づくテスト生成法を提案し，そのテスト品質と診断分解能を評価する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been proposed. Moreover, fault sensitization coverage was proposed as a measure of test quality, and an n-detection test generation method to improve fault sensitization coverage. In the test generation method, test patterns are generated such that target faults are propagated to as many signal lines as possible. The experimental results showed that test sets with high fault sensitization coverage achieved the high fault coverage for various fault models. In the test generation method based on fault sensitization coverage, the path graph for each fault used to select fault propagation paths holds the number of unsensitized path segments from the failure location to the reachable primary outputs. Therefore, there is a problem that the required memory becomes enormous and it is difficult to apply it to large circuits. In this paper, we propose a test generation method based on fault sensitization coverage that can be applied to large circuits by reducing the memory required for the selection of fault propagation paths, and evaluate the test quality and the diagnosis resolution.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2022-03-03","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"25","bibliographicVolumeNumber":"2022-SLDM-198"}]},"relation_version_is_last":true,"weko_creator_id":"44499"}}