{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00216661","sets":["1164:6389:10832:10833"]},"path":["10833"],"owner":"44499","recid":"216661","title":["AArch64の呼び出し規約に則ったアンワインド情報検査システムの開発"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-02-28"},"_buckets":{"deposit":"58423066-bb60-48b3-af9f-503f2ad201f8"},"_deposit":{"id":"216661","pid":{"type":"depid","value":"216661","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"AArch64の呼び出し規約に則ったアンワインド情報検査システムの開発","author_link":["559610","559609","559611"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"AArch64の呼び出し規約に則ったアンワインド情報検査システムの開発"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ICSS","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2022-02-28","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪大学工学部電子情報工学科"},{"subitem_text_value":"大阪大学大学院工学研究科"},{"subitem_text_value":"大阪大学大学院工学研究科／北陸先端科学技術大学院大学"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/216661/files/IPSJ-SPT22046018.pdf","label":"IPSJ-SPT22046018.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SPT22046018.pdf","filesize":[{"value":"1.6 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"46"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"44167762-cf7c-4287-ad7f-2a84ed809572","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"川口, 哲弘"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"高野, 祐輝"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"宮地, 充子"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12628305","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8671","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"高級言語で実装されたプログラム実行時のスタックアンワインドは，DWARF で記述されたデバッグ情報に基づいてなされている．この情報は，Theseus というメモリ安全性に重きを置く OS にも利用されており，障害回復の一端を担っている．しかし，このデバッグ情報にはバグが存在するという報告がされており，信頼性が失われている．この問題に対して，x86_64 アーキテクチャコンピュータ用のデバッグ情報の検査システムが提案されている．しかし，このシステムでは，呼び出し規約の異なる AArch64 アーキテクチャのコンピュータでは対応できない．本論文では，x86_64 アーキテクチャと AArch64 アーキテクチャの違いを踏まえ，AArch64 アーキテクチャ用のデバッグ情報の検査システムを提案する．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告セキュリティ心理学とトラスト（SPT）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2022-02-28","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"18","bibliographicVolumeNumber":"2022-SPT-46"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":216661,"updated":"2025-01-19T15:46:38.098834+00:00","links":{},"created":"2025-01-19T01:17:10.948225+00:00"}