{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00214029","sets":["1164:2036:10484:10753"]},"path":["10753"],"owner":"44499","recid":"214029","title":["オンチップモニタを用いたダイナミック電圧ドロップ診断"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-11-24"},"_buckets":{"deposit":"9e100554-3e76-46e1-8147-726557547b21"},"_deposit":{"id":"214029","pid":{"type":"depid","value":"214029","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"オンチップモニタを用いたダイナミック電圧ドロップ診断","author_link":["548329","548328","548323","548330","548327","548333","548332","548331","548334","548326","548324","548325"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"オンチップモニタを用いたダイナミック電圧ドロップ診断"},{"subitem_title":"Diagnosis of Switching-Induced IR Drop by On-Chip Voltage Monitors","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ハードウェアセキュリティ","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2021-11-24","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"Aristotle University"},{"subitem_text_value":"IMEC Leuven"},{"subitem_text_value":"Aristotle University Thessaloniki"},{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"IMEC Leuven"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Aristotle University","subitem_text_language":"en"},{"subitem_text_value":"IMEC Leuven","subitem_text_language":"en"},{"subitem_text_value":"Aristotle University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"IMEC Leuven","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/214029/files/IPSJ-SLDM21196020.pdf","label":"IPSJ-SLDM21196020.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM21196020.pdf","filesize":[{"value":"2.1 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"c040f8f6-1667-4fd6-8529-60e44339571e","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2021 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"門田, 和樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Leonidas, Kataselas"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ferenc, Fodor"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Alkis, Hatzopoulos"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"永田, 真"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Erik, Jan Marinissen"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kazuki, Monta","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Leonidas, Kataselas","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ferenc, Fodor","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Alkis, Hatzopoulos","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Makoto, Nagata","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Erik, Jan Marinissen","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"オンチップモニタ回路 (OCM) を用いる事により，電源レギュレータモジュール (µVRM) により区切られた電源ドメイン内のダイナミック電圧ドロップ波形を取得する事が出来る．本稿では OCM を用いて大規模集積回路 (VLSI) 内の電源ノイズ波形を取得し，電源ノイズ波形から電源ドメイン内の回路のスイッチング数の時間変動を 算出する．算出した推測スイッチング数とシミュレーションにより求めたスイッチング数に乖離がある事は (1) 評価 回路の不良，もしくは (2) テストプログラムの不良のいずれかである事を示唆する．本稿では OCM で取得した電圧ドロップ波形を用いたトグル診断手法を提案した．さらに，180 nm CMOS プロセスでテストチップを作成し，提案手法のデモンストレーションを行った．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"On-chip monitor (OCM) circuits enable us to observe dynamic power-supply (PS) waveforms within power domains individually partitioned by dedicated micro voltage regulator modules (μVRMs). In this paper, OCM is used to diagnose VLSI circuits with a modular power management and the combinational logics are precisely captured in the OCM voltage waveforms. A mismatch between simulation and measurement warns us of either (1) malfunction in the hardware module, or (2) defects in the test program. In this paper, we demonstrate an IR-drop-based toggle diagnosis technique using OCM for a prototype chip in 180 nm CMOS technology.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"4","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2021-11-24","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"20","bibliographicVolumeNumber":"2021-SLDM-196"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":214029,"updated":"2025-01-19T16:55:49.414414+00:00","links":{},"created":"2025-01-19T01:14:52.004064+00:00"}