{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00214028","sets":["1164:2036:10484:10753"]},"path":["10753"],"owner":"44499","recid":"214028","title":["デュアルモードSAR ADCを用いた電源ノイズ解析攻撃の検知手法の考案"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-11-24"},"_buckets":{"deposit":"5a737600-d368-42c2-a4d5-b123d16a7f48"},"_deposit":{"id":"214028","pid":{"type":"depid","value":"214028","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"デュアルモードSAR ADCを用いた電源ノイズ解析攻撃の検知手法の考案","author_link":["548318","548319","548321","548320","548322","548317"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"デュアルモードSAR ADCを用いた電源ノイズ解析攻撃の検知手法の考案"},{"subitem_title":"A Dual-mode SAR ADC to Detect Power Analysis Attack","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ハードウェアセキュリティ","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2021-11-24","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/214028/files/IPSJ-SLDM21196019.pdf","label":"IPSJ-SLDM21196019.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM21196019.pdf","filesize":[{"value":"2.8 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"45f7c0f7-82ef-42be-b3b4-02a804ace9d2","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2021 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"弘原海, 拓也"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三木, 拓司"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"永田, 真"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takuya, Wadatsumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takuji, Miki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Makoto, Nagata","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"IoT 機器が悪意のある攻撃者の標的として脅威に晒されている．そこで，電源ラインに対する意図的な機器挿入に起因するインピーダンスの変化をオンチップモニタ回路 (OCM) で取得した電源ノイズ波形から読み取 ることで異常の検知及び診断を可能とするフローを提案する．65nm CMOS プロセスでテストチップを作成し，電源ラインに挿入した微小な抵抗および容量による電源ノイズ波形の変動を定量的に示し，実際の攻撃としてあり得る電圧プローブの挿入を検知出来ることを示した．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Distributed IoT devices are exposed to unexpected interferences by physical accesses by malicious attackers. An on-chip noise monitor using a dual-mode ADC is developed to detect the insertion of off-chip components as malicious attempts of power noise measurement attacks. Fabricated in 65 nm CMOS, the on-chip noise monitor is examined for the detectability of series resistor, parallel capacitors and voltage probe that are intentionally inserted on power lines.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"5","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2021-11-24","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"19","bibliographicVolumeNumber":"2021-SLDM-196"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":214028,"updated":"2025-01-19T16:55:50.611366+00:00","links":{},"created":"2025-01-19T01:14:51.945093+00:00"}