{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00213198","sets":["1164:10193:10565:10720"]},"path":["10720"],"owner":"44499","recid":"213198","title":["エラー抑制法を組み込んだ量子計測"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-10-07"},"_buckets":{"deposit":"d1fb68f7-44ba-4f08-a95b-97cd52167381"},"_deposit":{"id":"213198","pid":{"type":"depid","value":"213198","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"エラー抑制法を組み込んだ量子計測","author_link":["545060","545061","545059","545063","545062"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"エラー抑制法を組み込んだ量子計測"},{"subitem_title":"Error-mitigated quantum metrology","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2021-10-07","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"NTTコンピュータ&データサイエンス研究所"},{"subitem_text_value":"NTTコンピュータ&データサイエンス研究所"},{"subitem_text_value":"産業技術総合研究所新原理コンピューティング研究センター"},{"subitem_text_value":"産業技術総合研究所新原理コンピューティング研究センター"},{"subitem_text_value":"NTTコンピュータ&データサイエンス研究所"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"NTT Computer and Data Science Laboratories, NTT Corporation","subitem_text_language":"en"},{"subitem_text_value":"NTT Computer and Data Science Laboratories, NTT Corporation","subitem_text_language":"en"},{"subitem_text_value":"Research Center for Emerging Computing Technologies, National institute of Advanced Industrial Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Research Center for Emerging Computing Technologies, National institute of Advanced Industrial Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"NTT Computer and Data Science Laboratories, NTT Corporation","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/213198/files/IPSJ-QS21004004.pdf","label":"IPSJ-QS21004004.pdf"},"date":[{"dateType":"Available","dateValue":"2023-10-07"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-QS21004004.pdf","filesize":[{"value":"1.5 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"53"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"5498bf89-be93-49c6-888f-fc5cb847a99f","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2021 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"山本, 薫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"遠藤, 傑"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"箱嶋, 秀昭"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松崎, 雄一郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"徳永, 裕己"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12894105","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2435-6492","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"Quantum metrology has a potential for achieving high sensitivity by harnessing quantum effects and can be applied in various areas ranging from material science to biology. Because the sensitivity is reduced by decoherence, many efforts have been made to recover the sensitivity under the effect of the decoherence. However, most of the researches have considered only statistical errors: reducing general systematic errors remains almost unexplored. Actually, systematic errors could nullify the advantage of the quantum strategy over the classical one. Here, we propose error-mitigated quantum metrology, a protocol to mitigate systematic errors by combining quantum metrology with quantum error mitigation. We demonstrate that our protocol mitigates systematic errors and recovers the superclassical scaling in a practical situation under time-inhomogeneous noise. Our results pave the way for hybrid structures with quantum computing and quantum metrology.","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Quantum metrology has a potential for achieving high sensitivity by harnessing quantum effects and can be applied in various areas ranging from material science to biology. Because the sensitivity is reduced by decoherence, many efforts have been made to recover the sensitivity under the effect of the decoherence. However, most of the researches have considered only statistical errors: reducing general systematic errors remains almost unexplored. Actually, systematic errors could nullify the advantage of the quantum strategy over the classical one. Here, we propose error-mitigated quantum metrology, a protocol to mitigate systematic errors by combining quantum metrology with quantum error mitigation. We demonstrate that our protocol mitigates systematic errors and recovers the superclassical scaling in a practical situation under time-inhomogeneous noise. Our results pave the way for hybrid structures with quantum computing and quantum metrology.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"8","bibliographic_titles":[{"bibliographic_title":"量子ソフトウェア（QS）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2021-10-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicVolumeNumber":"2021-QS-4"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":213198,"updated":"2025-01-19T17:14:14.044656+00:00","links":{},"created":"2025-01-19T01:14:06.264158+00:00"}