{"id":212105,"created":"2025-01-19T01:13:07.427090+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00212105","sets":["1164:3925:10503:10641"]},"path":["10641"],"owner":"44499","recid":"212105","title":["PUFを信頼の基点としたRISC-V TEE環境の実装"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-07-12"},"_buckets":{"deposit":"94d28983-a74d-49f9-b530-037991e43335"},"_deposit":{"id":"212105","pid":{"type":"depid","value":"212105","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"PUFを信頼の基点としたRISC-V TEE環境の実装","author_link":["540294","540296","540297","540295","540293","540298"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"PUFを信頼の基点としたRISC-V TEE環境の実装"},{"subitem_title":"Implimentation of RISC-V TEE using PUF as Root of Trust","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"HWS ","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2021-07-12","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"立命館大学理工学研究科"},{"subitem_text_value":"セキュアオープンアーキテクチャ・エッジ基盤技術研究組合／産業技術総合研究所サイバーフィジカルセキュリティ研究センター"},{"subitem_text_value":"立命館大学理工学部"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Science and Technology, Ritsumeikan University","subitem_text_language":"en"},{"subitem_text_value":" Technology Research Association of Secure IoT Edge Application based on RISC-V Open Architecture / National Institute of Advanced Industrial Science and Technology, Cyber Physical Security Research Center","subitem_text_language":"en"},{"subitem_text_value":"Department of Science and Engineering, Ritsumeikan University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/212105/files/IPSJ-CSEC21094040.pdf","label":"IPSJ-CSEC21094040.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-CSEC21094040.pdf","filesize":[{"value":"2.6 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"30"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"e7d222a3-80ab-4821-a89e-7d2919a4ff68","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2021 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"吉田, 康太"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"須崎, 有康"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"藤野, 毅"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kota, Yoshida","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kuniyasu, Suzaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takeshi, Fujino","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11235941","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8655","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"Society5.0 において，フィジカル空間に配置された膨大な数の IoT デバイスから信頼できるデータを収集するためには，フィジカル空間に配置された IoT デバイスとソフトウェアの真正性を検証する必要がある．これは，暗号アルゴリズムのようなクリティカルな処理を通常の OS から隔離された環境で実行する TEE と，デバイスに実装された信頼の基点，デバイスとソフトウェアの真正性を第三者が確認する手段であるリモートアテステーションの技術  によって実現される．RISC-V Keystone は RISC-V ISA 上で TEE を実現するためのオープンフレームワークであるが， 現時点では TEE とリモートアテステーション機能のみが提供されており，信頼の基点の安全な実装は別途実施する必要がある．本稿では，RISC-V Keystone における信頼の基点として，PUF を使用する実装を紹介する．PUF を用いてデバイス固有鍵を生成することにより，セキュアな不揮発性メモリを実装して鍵書き込みを行う必要がなくなり，低コストで高いセキュリティを実現することができる．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In society 5.0, acquiring trustworthy data from a huge amount of IoT devices in physical spaces, it is important to verify the authenticity of IoT devices and software. It is achieved by TEE, root of trust, and remote attestation. TEE is an isolated execution environment to execute critical software such as cryptographic processes and handling secret keys. The root of trust provides a device-specific key and the remote attestation provides means for third parties to verify the authenticity of the device and software. RISC-V Keystone is an open framework to implement TEE on RISC-V ISA. Keystone provides TEE and remote attestation framework, however root of trust have to be additionally implemented. In this paper, we introduce an implementation that uses PUF as a root of trust in RISC-V Keystone. It is not necessary to deploy a secret key into a secure non-volatile memory by using PUF as a secure key generator, so high security can be realized at a low cost.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告コンピュータセキュリティ（CSEC）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2021-07-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"40","bibliographicVolumeNumber":"2021-CSEC-94"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"updated":"2025-01-19T17:36:09.353467+00:00","links":{}}