{"created":"2025-01-19T01:11:42.028658+00:00","updated":"2025-01-19T18:08:47.475952+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00210481","sets":["1164:1579:10482:10561"]},"path":["10561"],"owner":"44499","recid":"210481","title":["レジスタ転送レベル回路における故障診断容易化 のためのコントローラの制御信号のドントケア割当て法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-03-18"},"_buckets":{"deposit":"36be305e-6545-4e7c-8d8c-a9597d9bb487"},"_deposit":{"id":"210481","pid":{"type":"depid","value":"210481","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"レジスタ転送レベル回路における故障診断容易化 のためのコントローラの制御信号のドントケア割当て法","author_link":["532989","532988","532987","532985","532986","532984"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"レジスタ転送レベル回路における故障診断容易化 のためのコントローラの制御信号のドントケア割当て法"},{"subitem_title":"A Don't Care Filling Method of Control Signals for Controllers to Enhance Fault Diagnosability at Register Transfer Level","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"高信頼化技術","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2021-03-18","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"明治大学情報コミュニケーション学部"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"College of Industrial Technology Nihon University","subitem_text_language":"en"},{"subitem_text_value":"College of Industrial Technology Nihon University","subitem_text_language":"en"},{"subitem_text_value":"School of Information and Communication, Meiji University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/210481/files/IPSJ-ARC21244032.pdf","label":"IPSJ-ARC21244032.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-ARC21244032.pdf","filesize":[{"value":"2.1 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"16"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"de0de09b-76c2-4901-bfa8-7db2987e9f4c","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2021 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"土渕, 航平"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"細川, 利典"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"山崎, 浩二"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kohei, Tsuchibuchi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toshinori, Hosokawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Koji, Yamazaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10096105","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8574","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年の半導体微細化技術の進歩に伴い，超大規模集積回路において，故障解析は歩留まりの向上のために重要である．被疑故障を事前に絞り込んでおく故障診断は，故障解析の重要なステップであり，故障解析コストの低減のために重要で ある．被疑故障数削減のためにゲートレベルやレイアウトレベルにおけるテストポイント挿入などの診断容易化設計が提案され ているが，面積オーバーヘッドやタイミングの最適性の損失という課題が発生する．本論文では，レジスタ転送レベルにおける 診断容易化設計手法を提案する．診断容易性のためのコントローラの各状態遷移における制御信号のドントケア割当て問題を疑似ブール最適化問題として定式化する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"With the progress of semiconductor technology in recent years, fault analysis is important to improve the yield of VLSIs. Fault diagnosis, which narrows down suspected faults in advance, is an important step in fault analysis and is important to reduce the cost of fault analysis. To reduce the number of suspected faults, design-for-diagnosability methods such as test point insertion at gate level and layout level have been proposed. However, the design-for-diagnosability methods cause problems such as area overhead and destroy of timing optimization. In this paper, we propose a design-for-diagnosability method at register transfer level. Don't care filling problem of control signals on each state transition of controllers for fault diagnosability is formulated as a pseudo-Boolean optimization problem.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システム・アーキテクチャ（ARC）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2021-03-18","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"32","bibliographicVolumeNumber":"2021-ARC-244"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":210481,"links":{}}