{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00210480","sets":["1164:1579:10482:10561"]},"path":["10561"],"owner":"44499","recid":"210480","title":["ニューラルネットワークを用いた被疑論理故障信号線の欠陥種類推定法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2021-03-18"},"_buckets":{"deposit":"58bcaedf-741e-40be-b768-d01a56669a50"},"_deposit":{"id":"210480","pid":{"type":"depid","value":"210480","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"ニューラルネットワークを用いた被疑論理故障信号線の欠陥種類推定法","author_link":["532982","532974","532977","532983","532975","532978","532980","532981","532979","532976"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ニューラルネットワークを用いた被疑論理故障信号線の欠陥種類推定法"},{"subitem_title":"An Estimation Method of Defect Types for Suspected Logical Faulty Lines Using Neural Networks","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"高信頼化技術","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2021-03-18","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"日本大学生産工学部"},{"subitem_text_value":"明治大学情報コミュニケーション学部"},{"subitem_text_value":"日本大学大学院生産工学研究科"},{"subitem_text_value":"日本大学大学院生産工学研究科   "}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Industrial Technology, Nihon University","subitem_text_language":"en"},{"subitem_text_value":"College of Industrial Technology, Nihon University","subitem_text_language":"en"},{"subitem_text_value":"College of Information and Communication, Meiji University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Industrial Technology, Nihon University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Industrial Technology, Nihon University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/210480/files/IPSJ-ARC21244031.pdf","label":"IPSJ-ARC21244031.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-ARC21244031.pdf","filesize":[{"value":"1.9 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"16"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"261d848b-acdf-4315-ae87-d222044a30d6","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2021 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"太田, 菜月"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"細川, 利典"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"山崎, 浩二"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"山内, ゆかり"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"新井, 雅之"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Natsuki, Ota","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toshinori, Hosokawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Koji, Yamazaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yukari, Yamauchi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masayuki, Arai","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10096105","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8574","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"特定の故障モデルの故障診断は誤診断や解なしという診断を起こす可能性があるため，スキャン設計回路を対象としたマルチサイクルキャプチャテスト集合を用いたユニバーサル論理故障モデルに対する故障診断法が提案されている．その故障診断手法では，被疑故障信号線の欠陥種類の推定がされないことが課題に残る．本論文では，被疑故障信号線に対して主な論理故障モデルである縮退故障，支配型ブリッジ故障，オープン故障を表すそれぞれの特徴量を求め，人工ニューラルネットワークを用いて，被疑故障信号線の欠陥種類を推定する手法を提案する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Since fault diagnosis methods for specified fault models might cause misprediction and non-prediction, a fault diagnosis method for a single universal logical fault model using multi-cycle capture test sets was proposed for scan design circuits. However, the problem remains that the fault diagnosis method does not estimate types of defects corresponding to suspected faults. In this paper, we propose an estimation method of defect types using neural networks with the features represent the major logical fault models such as stuck-at 0 fault, stuck-at 1 fault, dominant bridging fault, and open fault.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システム・アーキテクチャ（ARC）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2021-03-18","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"31","bibliographicVolumeNumber":"2021-ARC-244"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":210480,"updated":"2025-01-19T18:08:48.597259+00:00","links":{},"created":"2025-01-19T01:11:41.973599+00:00"}