{"updated":"2025-01-19T20:35:58.283395+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00203294","sets":["1164:2036:10071:10144"]},"path":["10144"],"owner":"44499","recid":"203294","title":["CNNを用いたLSIレイアウト画像の分類手法の検討"],"pubdate":{"attribute_name":"公開日","attribute_value":"2020-02-20"},"_buckets":{"deposit":"32df494f-9d95-4e50-b8ad-9ec7e968868a"},"_deposit":{"id":"203294","pid":{"type":"depid","value":"203294","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"CNNを用いたLSIレイアウト画像の分類手法の検討","author_link":["500687","500685","500680","500686","500682","500683","500684","500681"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"CNNを用いたLSIレイアウト画像の分類手法の検討"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"高信頼化技術","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2020-02-20","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"首都大学東京システムデザイン研究科"},{"subitem_text_value":"首都大学東京システムデザイン研究科"},{"subitem_text_value":"首都大学東京システムデザイン研究科"},{"subitem_text_value":"首都大学東京システムデザイン学部"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical Eng. and Sci., Tokyo Metropolitan University","subitem_text_language":"en"},{"subitem_text_value":"Department of Electrical Eng. and Sci., Tokyo Metropolitan University","subitem_text_language":"en"},{"subitem_text_value":"Department of Electrical Eng. and Sci., Tokyo Metropolitan University","subitem_text_language":"en"},{"subitem_text_value":"Tokyo Metropolitan University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/203294/files/IPSJ-SLDM20191011.pdf","label":"IPSJ-SLDM20191011.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM20191011.pdf","filesize":[{"value":"2.9 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"ea0677bc-3ec3-4a8e-a423-13052fdddb99","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2020 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"村川, 魁"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"藤田, 樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"永村, 美一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"福本, 聡"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kai, Murakawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Itsuki, Fujita","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yoshikazu, Nagamura","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Satoshi, Fukumoto\\n","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"現在，半導体集積回路 (以下,LSI) は種々の工業製品や社会インフラの構成に不可欠であり，その信頼性を確保することは重要である. LSI に不良が生じる原因は多岐にわたるが，回路レイアウトに起因する問題が少なくない．設計基準を順守した回路レイアウトであっても製造過程で不良を発生させることがある．本研究では，LSI の不具合を予測することを目的として AI 技術を用いて回路レイアウトを解析する技術について検討した．今回は，回路レイアウト画像を CNN (畳み込みニューラルネットワーク) で分類するにあたり，入力画像にどのような処理を施すと精度が上がるのかを過学習という点に着目して考察した．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2020-02-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicVolumeNumber":"2020-SLDM-191"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"created":"2025-01-19T01:05:43.742280+00:00","id":203294,"links":{}}