{"created":"2026-02-19T09:53:54.019047+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:02007709","sets":["1164:1384:1771205742511:1771205807242"]},"path":["1771205807242"],"owner":"80578","recid":"2007709","title":["Reactアプリケーションの変更差分解析に基づくUIテストケース破損の自動修正"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2026-03-02"},"_buckets":{"deposit":"5c7078a0-cac9-48ec-93c1-fc31f648b796"},"_deposit":{"id":"2007709","pid":{"type":"depid","value":"2007709","revision_id":0},"owners":[80578],"status":"published","created_by":80578},"item_title":"Reactアプリケーションの変更差分解析に基づくUIテストケース破損の自動修正","author_link":[],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Reactアプリケーションの変更差分解析に基づくUIテストケース破損の自動修正","subitem_title_language":"ja"}]},"item_type_id":"4","publish_date":"2026-03-02","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京科学大学情報理工学院"},{"subitem_text_value":"東京科学大学情報理工学院"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"School of Computing, Institute of Science Tokyo","subitem_text_language":"en"},{"subitem_text_value":"School of Computing, Institute of Science Tokyo","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/2007709/files/IPSJ-SE26222009.pdf","label":"IPSJ-SE26222009.pdf"},"date":[{"dateType":"Available","dateValue":"2028-03-02"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SE26222009.pdf","filesize":[{"value":"1.1 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"12"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"63cb7304-9e28-46b1-9ade-cb8edab1bd85","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2026 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"池田,むつき"}]},{"creatorNames":[{"creatorName":"小林,隆志"}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10112981","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8825","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"Webアプリケーション開発において，アプリケーションの品質を保つために自働化されたUIテストを用いる開発者は多い．しかし，このようなテストはアプリケーションの進化によって容易に壊れてしまうため，テストの維持が開発者にとって大きな負担となっている．そこで本研究では，アプリケーションコードの差分解析結果をもとに破損したテストステップを自動で修復する手法を提案する．オープンソースの開発プロジェクト2件に対し実験を実施し，ベースラインと精度と実行時間を比較したところ，ベースラインと同程度の実行時間でより高い精度を達成できることを確認した．また，少ないオーバーヘッドで実行時エラーを伴わないテスト破損の有無をチェックできることを確認した．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"8","bibliographic_titles":[{"bibliographic_title":"研究報告ソフトウェア工学（SE）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2026-03-02","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9","bibliographicVolumeNumber":"2026-SE-222"}]},"relation_version_is_last":true,"weko_creator_id":"80578"},"id":2007709,"updated":"2026-02-19T09:53:57.994358+00:00","links":{}}