{"created":"2025-01-19T01:04:02.304942+00:00","updated":"2025-01-19T21:20:46.356234+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00200422","sets":["1164:6089:9744:9973"]},"path":["9973"],"owner":"44499","recid":"200422","title":["情報基礎科目における毎週の出席およびテスト結果を用いた履修初期での合否予測手法の比較検討"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-11-08"},"_buckets":{"deposit":"dbd55208-7c57-4bae-9bff-be53c57797fd"},"_deposit":{"id":"200422","pid":{"type":"depid","value":"200422","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"情報基礎科目における毎週の出席およびテスト結果を用いた履修初期での合否予測手法の比較検討","author_link":["487379","487380","487377","487378"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"情報基礎科目における毎週の出席およびテスト結果を用いた履修初期での合否予測手法の比較検討"},{"subitem_title":"Review on Comparing between Prediction Methods of At-risk Students to Use Weekly Data of Attendance and Quiz in the First-year University-wide Information Basic Course","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2019-11-08","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"熊本大学大学院自然科学教育部"},{"subitem_text_value":"熊本大学総合情報統括センター"},{"subitem_text_value":"熊本大学総合情報統括センター"},{"subitem_text_value":"熊本大学総合情報統括センター"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Kumamoto University Graduate School of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Kumamoto University Center for Management of Information Technologies","subitem_text_language":"en"},{"subitem_text_value":"Kumamoto University Center for Management of Information Technologies","subitem_text_language":"en"},{"subitem_text_value":"Kumamoto University Center for Management of Information Technologies","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/200422/files/IPSJ-CLE19029002.pdf","label":"IPSJ-CLE19029002.pdf"},"date":[{"dateType":"Available","dateValue":"2021-11-08"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-CLE19029002.pdf","filesize":[{"value":"2.4 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"45"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"56e4ca16-bde7-4aca-925e-8f2a28697cdb","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2019 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"森, 美樹子"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"久保田, 真一郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"杉谷, 賢一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"中野, 裕司"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12496725","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8620","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"週ごとに学習活動の成果となる出席や確認テストのデータを使い，授業を不合格になりそうな学生を早期に見つけ出すことができれば，早期に学習指導を行うことで，不合格者を減らすことができると考えられる．本報告では，全学的に行われる情報基礎科目を対象に，週ごとの出席状況と確認テストの結果を入力値として，データを整理した上で linearSVC による不合格者の予測とその精度を確認した．総合評価点と確認テストが関係することから，総合評価点を目的変数とし，出席および確認テストを説明変数とする重回帰分析を行い，LinearSVC の結果と比較した．比較した結果，LinearSVC による予測の正答率は早い授業回で，重回帰分析の結果より微小に高い精度となっていた．また，不可となる人を不可と判定できた割合を示す再現率は，早い授業回から重回帰分析が高い精度を示していた．さらに検討を進め，精度の向上を目指す予定である．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"4","bibliographic_titles":[{"bibliographic_title":"研究報告教育学習支援情報システム（CLE）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2019-11-08","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicVolumeNumber":"2019-CLE-29"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":200422,"links":{}}