{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00200152","sets":["1164:2822:9758:9962"]},"path":["9962"],"owner":"44499","recid":"200152","title":["単発DCストレス測定による負バイアス温度不安定性のAC特性を再現可能なモデル"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-11-06"},"_buckets":{"deposit":"b7c7ec5b-cb9a-412d-bba4-42d69fd14ad8"},"_deposit":{"id":"200152","pid":{"type":"depid","value":"200152","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"単発DCストレス測定による負バイアス温度不安定性のAC特性を再現可能なモデル","author_link":["486313","486310","486305","486312","486308","486309","486314","486311","486307","486306"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"単発DCストレス測定による負バイアス温度不安定性のAC特性を再現可能なモデル"},{"subitem_title":"NBTI Model Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2019-11-06","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"埼玉大学大学院理工学研究科"},{"subitem_text_value":"福岡大学工学部"},{"subitem_text_value":"東京理科大学理工学部"},{"subitem_text_value":"東京大学大規模集積システム設計教育研究センター"},{"subitem_text_value":"京都工芸繊維大学電気電子工学系"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Saitama Univ.","subitem_text_language":"en"},{"subitem_text_value":"Fukuoka Univ.","subitem_text_language":"en"},{"subitem_text_value":"Tokyo Univ. of Science","subitem_text_language":"en"},{"subitem_text_value":"The Univ. of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Kyoto Institute of Tech.","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/200152/files/IPSJ-EMB19052012.pdf","label":"IPSJ-EMB19052012.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-EMB19052012.pdf","filesize":[{"value":"707.1 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"42"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"3c7b1694-fd60-4320-ba1d-80526e45ae65","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2019 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"保坂, 巧"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"西澤, 真一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"岸田, 亮"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松本, 高士"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小林, 和淑"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"T., Hosaka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"S., Nishizawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"R., Kishida","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"T., Matsumoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"K., Kobayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12149313","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-868X","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"本論文ではコンパクトな負バイアス温度不安定性 (NBTI) モデルを提案する．提案モデルは反応拡散 (tn) およびホールトラッピング (log(t)) モデルに基づいている．単発長期の DC ストレス/リカバリ測定から得られたデータを利用し，DCストレス/リカバリだけでなく AC ストレス/リカバリを表現可能なモデルパラメータを抽出する．モデルパラメータ抽出に優先順位をつけることで，デューティ比の異なる AC ストレス/リカバリ特性を表現可能であることを示す．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In this paper, simple and compact Negative Bias Temperature Instabilily (NBTI) model is proposed. The model is based on the reaction-difiusion (tn) and hole-trapping (log(t)) theories. Data with a single shot of DC stress and recovery are utilized to extract model parameters. Our key idea is setting the priority in the model fitting process to be possible for replicating AC dependency of NBTI stress and recovery effect. The proposed model successfully replicates stress and recovery with various duty cycles.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告組込みシステム（EMB）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2019-11-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicVolumeNumber":"2019-EMB-52"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":200152,"updated":"2025-01-19T21:26:35.724321+00:00","links":{},"created":"2025-01-19T01:03:49.224357+00:00"}