{"updated":"2025-01-19T21:58:58.322798+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00198570","sets":["1164:6389:9696:9867"]},"path":["9867"],"owner":"44499","recid":"198570","title":["USB機器の電圧変化による個体識別の可能性"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-07-16"},"_buckets":{"deposit":"98fb4b84-7dce-4fd0-a070-c65e82e8b118"},"_deposit":{"id":"198570","pid":{"type":"depid","value":"198570","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"USB機器の電圧変化による個体識別の可能性","author_link":["479013","479015","479011","479012","479014","479010","479008","479009"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"USB機器の電圧変化による個体識別の可能性"},{"subitem_title":"Possibility of Identifying USB Device by Voltage Changing","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2019-07-16","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"横浜国立大学"},{"subitem_text_value":"横浜国立大学"},{"subitem_text_value":"横浜国立大学"},{"subitem_text_value":"横浜国立大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Yokohama National University","subitem_text_language":"en"},{"subitem_text_value":"Yokohama National University","subitem_text_language":"en"},{"subitem_text_value":"Yokohama National University","subitem_text_language":"en"},{"subitem_text_value":"Yokohama National University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/198570/files/IPSJ-SPT19034062.pdf","label":"IPSJ-SPT19034062.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SPT19034062.pdf","filesize":[{"value":"1.7 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"46"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"491cb5fa-6df8-4e82-9cdf-431cda42148c","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2019 by the Institute of Electronics， Information and Communication Engineers This SIG report is only available to those in membership of the SIG．"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"外山, 拓"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"坂本, 純一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"吉田, 直樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松本, 勉"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Taku, Toyama","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Junichi, Sakamoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Naoki, Yoshida","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsutomu, Matsumoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12628305","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8671","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年，USB メモリによるマルウェア感染や BadUSB による不正なキー入力，ハードウェアキーロガーによるキー入力の窃取など，不正な USB 機器が問題となっている．不正なUSB 機器の接続を防ぐ手法としては USB 機器側に秘密情報を保存する手法が主流である．その一方で，物理的特徴を人工物の個体認証に用いる人工物メトリクスの研究が進められている．我々は，同様のアプローチとして，USB機器が発生させる，信号波形及び電源電圧変化の個別性を調べることにより，USB機器の個体識別を行うことが可能かどうかの検討を行った．我々は，実験により，異なる型番を持つ USB 機器間であれば識別は可能であり，不正な USB 機器の接続を防ぐ．ことに対して一定の効果がある可能性を示す．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In recent years, illegal USB devices have become problematic, such as malware infection by USB memory, incorrect key input by BadUSB, and stealing of key input by hardware key logger. As a method to prevent unauthorized USB device connection, the method of storing secret information on the USB device side is the mainstream. On the other hand, research on artifact-based metrics using physical characteristics for identification of artifacts is in progress. As a similar approach, we examined whether it is possible to identify individual USB devices by examining the individuality of signal waveforms and power supply voltage changes generated by USB devices. In our experiments, we can distinguish between USB devices with different model numbers, and show that it may have certain effects on preventing unauthorized USB device connections.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告セキュリティ心理学とトラスト（SPT）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2019-07-16","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"62","bibliographicVolumeNumber":"2019-SPT-34"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"created":"2025-01-19T01:02:44.993448+00:00","id":198570,"links":{}}