{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00195787","sets":["1164:4088:9695:9775"]},"path":["9775"],"owner":"44499","recid":"195787","title":["Fault tolerance evaluation of wide area distributed application based on exhaustive FIT scenario generation"],"pubdate":{"attribute_name":"公開日","attribute_value":"2019-05-16"},"_buckets":{"deposit":"ce69bd04-e286-4369-b63b-14971e98f29e"},"_deposit":{"id":"195787","pid":{"type":"depid","value":"195787","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"Fault tolerance evaluation of wide area distributed application based on exhaustive FIT scenario generation","author_link":["467466","467465","467463","467464"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Fault tolerance evaluation of wide area distributed application based on exhaustive FIT scenario generation"},{"subitem_title":"Fault tolerance evaluation of wide area distributed application based on exhaustive FIT scenario generation","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2019-05-16","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Osaka University"},{"subitem_text_value":"National Institute of Informatics／Osaka University"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Osaka University","subitem_text_language":"en"},{"subitem_text_value":"National Institute of Informatics / Osaka University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/195787/files/IPSJ-IOT19045015.pdf","label":"IPSJ-IOT19045015.pdf"},"date":[{"dateType":"Available","dateValue":"2021-05-16"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-IOT19045015.pdf","filesize":[{"value":"1.8 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"43"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"4d46aa78-1328-4f43-9517-2101d395973b","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2019 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shinnosuke, Miura"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hiroki, Kashiwazaki"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shinnosuke, Miura","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hiroki, Kashiwazaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12326962","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8787","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"A wide area distributed application is affected by network faults due to natural disasters because the servers on which the application operates are distributed geographically in a wide area． Fault Injection Testing (FIT) is a method for verifying fault tolerance of widely distributed applications． In this paper， by limiting network failures to line disconnections， all FIT scenarios are generated and exhaustive evaluation of fault tolerance is performed． Authors evaluate the visualization method of performance data obtained from this evaluation and the reduction of the fault tolerance evaluation cost by the proposed method．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"A wide area distributed application is affected by network faults due to natural disasters because the servers on which the application operates are distributed geographically in a wide area. Fault Injection Testing (FIT) is a method for verifying fault tolerance of widely distributed applications. In this paper, by limiting network failures to line disconnections, all FIT scenarios are generated and exhaustive evaluation of fault tolerance is performed. Authors evaluate the visualization method of performance data obtained from this evaluation and the reduction of the fault tolerance evaluation cost by the proposed method.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"8","bibliographic_titles":[{"bibliographic_title":"研究報告インターネットと運用技術（IOT）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2019-05-16","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"15","bibliographicVolumeNumber":"2019-IOT-45"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":195787,"updated":"2025-01-19T22:55:34.645505+00:00","links":{},"created":"2025-01-19T01:00:41.465433+00:00"}