{"id":192638,"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00192638","sets":["1164:2822:9431:9614"]},"path":["9614"],"owner":"44499","recid":"192638","title":["論理BISTのテスト電力制御手法とTEG評価について"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-11-28"},"_buckets":{"deposit":"c8adaefe-3e38-4ea2-b7ed-aba2abe2934d"},"_deposit":{"id":"192638","pid":{"type":"depid","value":"192638","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"論理BISTのテスト電力制御手法とTEG評価について","author_link":["450074","450073","450075","450072","450077","450076","450078","450079"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"論理BISTのテスト電力制御手法とTEG評価について"},{"subitem_title":"Evaluation of Flexible Test Power Control for Logic BIST in TEG Chips","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト生成・テスト容易化設計","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2018-11-28","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"愛媛大学"},{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology,","subitem_text_language":"en"},{"subitem_text_value":"Ehime University,","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology,","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology,","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/192638/files/IPSJ-EMB18049024.pdf","label":"IPSJ-EMB18049024.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-EMB18049024.pdf","filesize":[{"value":"677.2 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"42"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"5726bb96-eef3-4e2b-bdb9-41690137cd61","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2018 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"加藤, 隆明"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"王, 森レイ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"佐藤, 康夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"梶原, 誠司"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takaaki, Kato","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Senling, Wang","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yasuo, Sato","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Seiji, Kajihara","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12149313","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-868X","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"スキヤンベースの論理 BIST では，過度のテスト時消費電力が問題となる．一方，電力削減は故障検出率向上及びテスト時間削減とのトレードオフであるため，単に電力削減だけではなくテスト対象回路毎に適した電力レベルでのテストが必要となる．本稿では，テスト電力制御と故障検出率向上のためのスキャンイン電力制御手法にスキャンアウト及びキャプチヤ電力低減手法を組合せた総合的なテスト電力制御手法の評価を行った．論理 ／ 故障シミュレーション評価及び TEG 実測定評価でテスト電力制御の有効性を示す．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Scan-based logic BIST has a crucial problem of high test power dissipation. Its solution requires a flexible test power control specified for each circuit because of trade-otf between test power, fault coverage, and test application time. This paper addresses evaluation of the scan-in power reduction techniques with scan-out and capture reduction techniques. In addition to simulation-based experiments, measurement results of TEG chips' experiments are shown to make sure the effectiveness of the techniques.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告組込みシステム（EMB）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2018-11-28","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"24","bibliographicVolumeNumber":"2018-EMB-49"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"updated":"2025-01-20T00:03:44.523369+00:00","created":"2025-01-19T00:58:20.228926+00:00","links":{}}