{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00190504","sets":["1164:3925:9381:9511"]},"path":["9511"],"owner":"11","recid":"190504","title":["スマートデバイスからの電磁情報漏えい源特定に関する基礎検討"],"pubdate":{"attribute_name":"公開日","attribute_value":"2018-07-18"},"_buckets":{"deposit":"e0871e02-c0aa-49bf-bb9b-a2f0ad64144d"},"_deposit":{"id":"190504","pid":{"type":"depid","value":"190504","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"スマートデバイスからの電磁情報漏えい源特定に関する基礎検討","author_link":["436019","436023","436024","436025","436020","436021","436022","436018"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"スマートデバイスからの電磁情報漏えい源特定に関する基礎検討"},{"subitem_title":"Fundamental Study on Identification of EM Leakage Source of Audio Information from a Smart Device","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2018-07-18","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"仙台高等専門学校"},{"subitem_text_value":"奈良先端科学技術大学院大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Information Science, Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science, Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"National Institute of Technology, Sendai College","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science, Nara Institute of Science and Technology","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/190504/files/IPSJ-CSEC18082013.pdf","label":"IPSJ-CSEC18082013.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-CSEC18082013.pdf","filesize":[{"value":"814.4 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"30"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"9533ef06-68fb-4374-92b4-2e3b0204a5fe","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2018 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"仁科, 泉美"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"藤本, 大介"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"衣川, 昌宏"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"林, 優一"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Izumi, Nishida","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Daisuke, Fujimoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masahiro, Kinugawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yu-ichi, Hayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11235941","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8655","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"音声出力機能のあるスマートデバイスから電磁波を通じて音情報が漏えいする脅威が報告されている．電磁波を通じた音情報の漏えいを抑制するには，音情報を伝搬する周波数帯や音情報の漏えいを引き起こすデバイス部位を把握することが有用であるが，これまでこうした検討は十分なされてない．本稿では，漏えいを抑制するために必要となる基礎知見を与えるため，音声再生に関連するデバイスの構成部品から放射される電磁波を測定し，放射電磁界の強度に関する分布図を作成することで漏えい源となる部位を絞り込む．そして，分布図によって絞り込まれた範囲内に漏えい源があることを確認するため，特定した範囲内にある電子素子を取り出し，素子単体から放射される電磁波を測定し，AM 復調することにより音情報の漏えい源を特定する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"A threat of leakage of sound information via electromagnetic field from a smart device having an audio output function has been reported. To suppress leakage of sound information through EM waves, it is useful to search frequency bands that propagate sound information and electrical components that cause leakage of audio information. However, there is not enough discussion about the electrical components causing information leakage. In this paper, to provide the fundamental knowledge necessary to suppress leakage, we measure the EM field including audio information radiated from the components of the device and create cartography relating to the intensity of the radiated EM field. Thereby, we are able to find out the part causing information leakage. Finally, we verify the leakage source by extracting component and measuring EM waves from the component.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告コンピュータセキュリティ（CSEC）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2018-07-18","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"13","bibliographicVolumeNumber":"2018-CSEC-82"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"id":190504,"updated":"2025-01-20T01:10:25.462238+00:00","links":{},"created":"2025-01-19T00:56:28.057766+00:00"}