Estimation of Delay Test Quality and Its Application to Test Generation

• Item type: Trans(1)
• 公開日: 2008-08-27
• タイトル: Estimation of Delay Test Quality and Its Application to Test Generation
• タイトル / 言語: en
• タイトル: Estimation of Delay Test Quality and Its Application to Test Generation
• 言語: eng
• キーワード / 主題Scheme: Other
• キーワード / 主題: Delay Testing
• 資源タイプ / 資源タイプ識別子: http://purl.org/coar/resource_type/c_6501
• 資源タイプ: journal article
• 著者所属: Kyushu Institute of Technology
• 著者所属: Kyushu Institute of Technology
• 著者所属: Kyushu Institute of Technology
• 著者所属: Kyushu Institute of Technology
• 著者所属: Semiconductor Technology Academic Research Center
• 著者所属: Semiconductor Technology Academic Research Center
• 著者所属: Semiconductor Technology Academic Research Center
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Semiconductor Technology Academic Research Center
• 著者所属(英): en
• 著者所属(英): Semiconductor Technology Academic Research Center
• 著者所属(英): en
• 著者所属(英): Semiconductor Technology Academic Research Center
• 著者名: Seiji, Kajihara; Shohei, Morishima; Masahiro, Yamamoto; Xiaoqing, Wen; Masayasu, Fukunaga; Kazumi, Hatayama; Takashi, Aikyo
• 著者名(英): Seiji, Kajihara; Shohei, Morishima; Masahiro, Yamamoto; Xiaoqing, Wen; Masayasu, Fukunaga; Kazumi, Hatayama; Takashi, Aikyo
• 論文抄録 / 内容記述タイプ: Other
• 論文抄録 / 内容記述: As a method to evaluate delay test quality of test patterns SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM the following two things are important: for each transition fault (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.
• 論文抄録(英) / 内容記述タイプ: Other
• 論文抄録(英) / 内容記述: As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.
• 書誌レコードID / 収録物識別子タイプ: NCID
• 書誌レコードID / 収録物識別子: AA12394951
• 書誌情報: IPSJ Transactions on System LSI Design Methodology （TSLDM）; 巻 1, p. 104-115, 発行日 2008-08-27
• ISSN / 収録物識別子タイプ: ISSN
• ISSN / 収録物識別子: 1882-6687
• 出版者 / 言語: ja
• 出版者: 情報処理学会