{"created":"2025-01-19T00:51:26.420066+00:00","updated":"2025-01-20T03:27:30.512145+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00183957","sets":["1164:2036:9049:9273"]},"path":["9273"],"owner":"11","recid":"183957","title":["スキャンベース論理BISTにおけるマルチサイクルテストの中間観測FF選出手法について"],"pubdate":{"attribute_name":"公開日","attribute_value":"2017-10-30"},"_buckets":{"deposit":"8ed73edb-2c8b-49ce-a185-57b9b6b9b96e"},"_deposit":{"id":"183957","pid":{"type":"depid","value":"183957","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"スキャンベース論理BISTにおけるマルチサイクルテストの中間観測FF選出手法について","author_link":["405179","405180","405181","405177","405183","405176","405174","405178","405182","405175"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"スキャンベース論理BISTにおけるマルチサイクルテストの中間観測FF選出手法について"},{"subitem_title":"Flip-Flop Selection for Multi-Cycle Test with Partial Observation in Scan-Based Logic BIST","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト生成およびテスト容易化設計","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2017-10-30","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"愛媛大学"},{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Ehime Universities","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/183957/files/IPSJ-SLDM17181016.pdf","label":"IPSJ-SLDM17181016.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM17181016.pdf","filesize":[{"value":"741.1 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"26806566-351c-4c13-9f01-1a2da5dd55e0","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2017 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"大島, 繁之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"加藤, 隆明"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"王, 森レイ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"佐藤, 康夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"梶原, 誠司"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shigeyuki, Oshima","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takaaki, Kato","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Senling, Wang","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yasuo, Sato","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Seiji, Kajihara","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"論理 BIST における故障検出率向上のために，マルチサイクルテストにおけるフリップフロップ (FF) 値の中間観測手法が提案されている．しかし既存手法では，中間観測する FF 数，すなわち中間観測による面積オーバヘッドと故障検出率とはトレードオフの関係にある．本研究では，テスト対象回路の回路接続情報を解析することで，故障検出率向上及び回路面積増大を抑制する中間観測 FF 選出手法を提案する．評価実験により，面積オーバヘッドは既存手法から 87.5% 削減が可能であることを確認できた．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"A logic BIST scheme using multi-cycle test with partial observation has been proposed. In the scheme, the selection of flip-flops for partial observation plays an important role for improving the fault coverage and reducing the area overhead. This paper proposes a selection method of flip-flops for partial observation that can maximize the fault coverage under the limitation of the number of flip-flops. Experimental results show that the proposed method can obtain higher fault coverage than the existing flip-flop selection method and results in less area overhead.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2017-10-30","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"16","bibliographicVolumeNumber":"2017-SLDM-181"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"id":183957,"links":{}}