{"updated":"2025-01-22T23:01:22.313971+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00018008","sets":["934:1085:1096:1100"]},"path":["1100"],"owner":"1","recid":"18008","title":["光干渉縞や投影格子の波形の位相を用いた三次元形状・変形計測"],"pubdate":{"attribute_name":"公開日","attribute_value":"2006-03-15"},"_buckets":{"deposit":"7e327b21-6563-4d9b-b7be-e93df1c60897"},"_deposit":{"id":"18008","pid":{"type":"depid","value":"18008","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"光干渉縞や投影格子の波形の位相を用いた三次元形状・変形計測","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"光干渉縞や投影格子の波形の位相を用いた三次元形状・変形計測"},{"subitem_title":"Shape and Deformation Measurement by Phase Analysis of Interference Fringes or Projected Gratings","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"総合論文","subitem_subject_scheme":"Other"}]},"item_type_id":"3","publish_date":"2006-03-15","item_3_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"和歌山大学"},{"subitem_text_value":"和歌山大学"},{"subitem_text_value":"和歌山大学"}]},"item_3_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Wakayama University","subitem_text_language":"en"},{"subitem_text_value":"Wakayama University","subitem_text_language":"en"},{"subitem_text_value":"Wakayama University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/18008/files/IPSJ-TCVIM4705004.pdf"},"date":[{"dateType":"Available","dateValue":"2008-03-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-TCVIM4705004.pdf","filesize":[{"value":"1.2 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"20"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"5d969706-9ffb-4b8a-8d96-a1e9d5ea6306","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2006 by the Information Processing Society of Japan"}]},"item_3_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"森本, 吉春"},{"creatorName":"松井, 徹"},{"creatorName":"藤垣, 元治"}],"nameIdentifiers":[{}]}]},"item_3_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yoshiharu, Morimoto","creatorNameLang":"en"},{"creatorName":"Toru, Matui","creatorNameLang":"en"},{"creatorName":"Motoharu, Fujigaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_3_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11560603","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_3_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-7810","subitem_source_identifier_type":"ISSN"}]},"item_3_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"形状や変形を計測する方法はすでに多くの方法が開発されているが，高速・高精度で計測できるものは少ない．ここでは各種光学的方法により得られた投影格子や縞画像の位相を利用した方法を紹介する．とくに，3～4枚の画像から矩形波格子や余弦波格子の位相分布が連続的に計測できる積分型位相シフト法，位相シフトした多数の画像の各点の輝度のフーリエ変換により高精度に位相を解析できるフーリエ変換位相シフト法，複数の基準板を用いた高精度形状計測法，位相シフトデジタルホログラフィ干渉法を用いた変位計測法は実時間で計測したり，計算時間が少しかかっても高精度に解析したりすることができる．ここでは著者らが主として開発した計測方法の原理とその適用例を示す．","subitem_description_type":"Other"}]},"item_3_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Accurate shape measurement methods using optical phase analysis proposed by authors are introduced. Especially, the theory and applications of the integrated phase-shifting method, the phase-shifting method using Fourier transform, the accurate shape measurement method using a reference plate, and the digital holographic interferometry using windowed holograms are explained.","subitem_description_type":"Other"}]},"item_3_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"19","bibliographic_titles":[{"bibliographic_title":"情報処理学会論文誌コンピュータビジョンとイメージメディア（CVIM）"}],"bibliographicPageStart":"10","bibliographicIssueDates":{"bibliographicIssueDate":"2006-03-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"SIG5(CVIM13)","bibliographicVolumeNumber":"47"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"created":"2025-01-18T22:50:51.368347+00:00","id":18008,"links":{}}