{"updated":"2025-01-20T06:39:13.602904+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00174532","sets":["6164:6165:7651:8901"]},"path":["8901"],"owner":"11","recid":"174532","title":["表面磁界観測による電流推定を用いた集積回路の電源網解析"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-09-07"},"_buckets":{"deposit":"1f75e869-3498-4329-aa1b-82ef0c2fcc33"},"_deposit":{"id":"174532","pid":{"type":"depid","value":"174532","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"表面磁界観測による電流推定を用いた集積回路の電源網解析","author_link":["359662","359661","359663","359665","359659","359660","359664","359658"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"表面磁界観測による電流推定を用いた集積回路の電源網解析"},{"subitem_title":"Analysis of VLSI Power Supply Network based on Current Estimation through Magnetic Field Measurement","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト・故障診断","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2016-09-07","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学工学系研究科電気系工学専攻"},{"subitem_text_value":"東京大学大規模集積システム設計教育研究センター"},{"subitem_text_value":"東京大学大規模集積システム設計教育研究センター"},{"subitem_text_value":"東京大学大規模集積システム設計教育研究センター"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical Engineering and Information Systems, The Universiry of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"VLSI Design and Education Center, The Universiry of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"VLSI Design and Education Center, The Universiry of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"VLSI Design and Education Center, The Universiry of Tokyo","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/174532/files/IPSJ-DAS2016016.pdf","label":"IPSJ-DAS2016016.pdf"},"date":[{"dateType":"Available","dateValue":"2018-09-07"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-DAS2016016.pdf","filesize":[{"value":"7.3 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"330","billingrole":"10"},{"tax":["include_tax"],"price":"330","billingrole":"44"}],"accessrole":"open_date","version_id":"444bf809-86cc-4bd0-afc7-72cffccd4fae","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2016 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"織田, 勇冴"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"飯塚, 哲也"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"名倉, 徹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"浅田, 邦博"}],"nameIdentifiers":[{}]}]},"item_18_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yuki, Oda","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tetsuya, Iizuka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toru, Nakura","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kunihiro, Asada","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"高い信頼性が要求される集積回路システムにおいては，回路全体に安定した電源電圧を供給するための高品質な電源網の設計が必須となっている．しかしながら，実際の動作時における電源網の状態や信頼性を実測により観測し分析することは困難であり，従来までは内部回路の遅延時間の変化などから電圧降下を推定するといった間接的な方法が取られることが多かった．本論文では，集積回路の表面磁界から電源網に流れる電流を推定することで，電源網における電流分布を可視化し，電流集中や電源網の不良箇所等の診断を行う手法を提案する．本手法を用いることで，高い信頼性が求められる集積回路に対して電源網の信頼性の評価を低コストで行うことができる．電磁界シミュレーションを用いた実験により，電源網における配線層間スルーホールの欠陥を観測した表面磁界から検出できることを実証した．","subitem_description_type":"Other"}]},"item_18_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"The modern VLSI systems that demand high reliability requires carefully-designed power/ground network to provide stable power supply. Though the power supply connection is verified before tapeout, it is quite difficult to evaluate its quality and reliability during the actual operating condition. Thus some indirect way such as measurement of delay of internal circuit is often used to estimate the power supply voltage. This paper proposes a way to evaluate the power supply network based on the measurement of magnetic field emission from LSI. The proposed method predicts the actual current flow from the magnetic field measurement results, and enables us to find defects or design faults with low cost. Experimental results using an electromagnetic field simulator demonstrates that the proposed method precisely predicts the current flow in the supply network and clearly indicates the VIA fault location.","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"90","bibliographic_titles":[{"bibliographic_title":"DAシンポジウム2016論文集"}],"bibliographicPageStart":"85","bibliographicIssueDates":{"bibliographicIssueDate":"2016-09-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"16","bibliographicVolumeNumber":"2016"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"created":"2025-01-19T00:44:43.427408+00:00","id":174532,"links":{}}