{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00174531","sets":["6164:6165:7651:8901"]},"path":["8901"],"owner":"11","recid":"174531","title":["論理BISTにおけるスキャンイン電力制御手法とTEG評価"],"pubdate":{"attribute_name":"公開日","attribute_value":"2016-09-07"},"_buckets":{"deposit":"7fb0815b-e8ad-4952-99ef-ad21b0340166"},"_deposit":{"id":"174531","pid":{"type":"depid","value":"174531","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"論理BISTにおけるスキャンイン電力制御手法とTEG評価","author_link":["359657","359651","359652","359648","359649","359650","359655","359656","359654","359653"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"論理BISTにおけるスキャンイン電力制御手法とTEG評価"},{"subitem_title":"A Flexible Scan-in Power Control Method for Scan-Based Logic BIST and Its Evaluation on TEG Chips","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト・故障診断","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2016-09-07","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"愛媛大学"},{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"},{"subitem_text_value":"九州工業大学"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Ehime University","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/174531/files/IPSJ-DAS2016015.pdf","label":"IPSJ-DAS2016015.pdf"},"date":[{"dateType":"Available","dateValue":"2018-09-07"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-DAS2016015.pdf","filesize":[{"value":"1.7 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"330","billingrole":"10"},{"tax":["include_tax"],"price":"330","billingrole":"44"}],"accessrole":"open_date","version_id":"e18672a2-ffe4-4d20-9d19-05f5e51f702a","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2016 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"加藤, 隆明"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"王, 森レイ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"佐藤, 康夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"梶原, 誠司"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"温, 暁青"}],"nameIdentifiers":[{}]}]},"item_18_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takaaki, Kato","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Senling, Wang","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yasuo, Sato","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Seiji, Kajihara","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Xiaoqing, Wen","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"スキャンベースの論理 BIST では，テスト時の過大な消費電力が問題となっている．適切なテスト時消費電力は回路毎に異なり，電力を下げ過ぎてもテスト品質の低下やパターン数増加によるテストコスト増加の問題を生じさせる．本研究では，論理 BIST のテストパターンに使われる疑似ランダムパターンに対して，スキャンイン時のトグル率が指定した目標値になるようパターンを変更し，テスト時の電力を制御する手法を提案する．目標トグル率を実現するテストパターンが多く存在する中で，本手法は故障検出率が高くなるようなパターンに変更する．実験では，目標トグル率に対する故障検出率評価や TEG チップの測定結果により，提案手法の有効性を示す．","subitem_description_type":"Other"}]},"item_18_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"High power dissipation during scan-based logic BIST is a crucial problem that can lead to over-testing or chip damage. Although low power technology is strongly required, controlling the test power of a circuit to an appropriate level in logic BIST is difficult. This paper proposes a novel power-controlling method to control the toggle rate in scan shift operation to an specified level by modifying pseudo random patterns generated by a TPG (Test Pattern Generator) in logic BIST. Different from previous methods, the proposed method is able to maintain high fault coverage without test time increase. Simulation-based experiments clearly demonstrate that the proposed method can control toggle rate during scan-in operation and evaluations on TEG chips show its impact on circuit delay.","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"84","bibliographic_titles":[{"bibliographic_title":"DAシンポジウム2016論文集"}],"bibliographicPageStart":"79","bibliographicIssueDates":{"bibliographicIssueDate":"2016-09-07","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"15","bibliographicVolumeNumber":"2016"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"id":174531,"updated":"2025-01-20T06:39:12.467567+00:00","links":{},"created":"2025-01-19T00:44:43.373878+00:00"}