{"updated":"2025-01-20T11:03:47.267379+00:00","links":{},"id":163895,"created":"2025-01-19T00:35:47.174178+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00163895","sets":["6504:8291:8749"]},"path":["8749"],"owner":"6748","recid":"163895","title":["データI/Oパターンに着目したテスト分析手法の提案"],"pubdate":{"attribute_name":"公開日","attribute_value":"2015-03-17"},"_buckets":{"deposit":"c2e0e097-d85c-4fbe-9b18-0aada26d6997"},"_deposit":{"id":"163895","pid":{"type":"depid","value":"163895","revision_id":0},"owners":[6748],"status":"published","created_by":6748},"item_title":"データI/Oパターンに着目したテスト分析手法の提案","author_link":["322120","322119","322121"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"データI/Oパターンに着目したテスト分析手法の提案"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ソフトウェア科学・工学","subitem_subject_scheme":"Other"}]},"item_type_id":"22","publish_date":"2015-03-17","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_22_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"筑波大"},{"subitem_text_value":"デバッグ工学研究所"},{"subitem_text_value":"筑波大"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/163895/files/IPSJ-Z77-5A-06.pdf","label":"IPSJ-Z77-5A-06.pdf"},"date":[{"dateType":"Available","dateValue":"2016-06-10"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-Z77-5A-06.pdf","filesize":[{"value":"347.7 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"8"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"f7eb0409-3d2d-42ba-88e5-6a7203656b0c","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2015 by the Information Processing Society of Japan"}]},"item_22_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"湯本, 剛"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松尾谷, 徹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"津田, 和彦"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_22_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00349328","subitem_source_identifier_type":"NCID"}]},"item_22_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ソフトウェアテストにおいては，重複が無く抜け漏れの無いテストケースをテストの実行前に作成しておくことが重要である．ブラックボックステストにおけるテストケースの作成は分析対象が仕様であり，一貫性を持ったルールのもとで行われることが少ない．結果的にテストケースの重複や抜け漏れを引き起こすことも多い．既存の研究にて，一貫性を持ったルールの基で分析を行う方法を提案しているが，本論文では，既存の方法に対して，更にテスト実行時のデータのI/Oに着目することで，より一貫性の高い分析を行う方法を提案する．","subitem_description_type":"Other"}]},"item_22_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"200","bibliographic_titles":[{"bibliographic_title":"第77回全国大会講演論文集"}],"bibliographicPageStart":"199","bibliographicIssueDates":{"bibliographicIssueDate":"2015-03-17","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicVolumeNumber":"2015"}]},"relation_version_is_last":true,"weko_creator_id":"6748"}}