{"links":{},"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00015873","sets":["581:892:893"]},"path":["893"],"owner":"1","recid":"15873","title":["正則な状態遷移図の全遷移を網羅するテストデータ生成アルゴリズム"],"pubdate":{"attribute_name":"公開日","attribute_value":"1984-11-15"},"_buckets":{"deposit":"069403f9-3c22-4ea2-88da-747d3575a9a0"},"_deposit":{"id":"15873","pid":{"type":"depid","value":"15873","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"正則な状態遷移図の全遷移を網羅するテストデータ生成アルゴリズム","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"正則な状態遷移図の全遷移を網羅するテストデータ生成アルゴリズム"},{"subitem_title":"An Algorithm to Generate Test Data for Covering All Transitions of Regular State - Transition Diagram","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"論文","subitem_subject_scheme":"Other"}]},"item_type_id":"2","publish_date":"1984-11-15","item_2_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"（株）日立製作所システム開発研究所第2部"}]},"item_2_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"2nd Department, Systems Development Laboratory, Hitachi, Ltd","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/15873/files/IPSJ-JNL2506008.pdf"},"date":[{"dateType":"Available","dateValue":"1986-11-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-JNL2506008.pdf","filesize":[{"value":"698.5 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"8"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"276758fa-74eb-4a8f-b719-2860252519cd","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 1984 by the Information Processing Society of Japan"}]},"item_2_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"渡辺, 坦"}],"nameIdentifiers":[{}]}]},"item_2_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Tan, Watanabe","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_2_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00116647","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_2_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-7764","subitem_source_identifier_type":"ISSN"}]},"item_2_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"プログラム仕様に基づくテストデータ自動生成は ソフトウエアの信頼性と生産性の向上のために強く望まれている.本論文では プログラム仕様を連接と場合分け 反復で構成される正則状態遷移図として書き 入出力を列挙型データとし 内部的制約条件を ある遷移に伴う内部出力が他の遷移を起動する内部入力となるという形で書くならば その遷移を網羅的にテストする入力系列の集合の自動生成がかなりの成功をおさめることを示す.自動生成の過程では 入口から出口に至る実行可能経路の探索のために 何段階かの副次目標を設定する.自動生成時間は 遷移数が数十個の場合 大型計算機で数秒から数十秒である.","subitem_description_type":"Other"}]},"item_2_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"969","bibliographic_titles":[{"bibliographic_title":"情報処理学会論文誌"}],"bibliographicPageStart":"960","bibliographicIssueDates":{"bibliographicIssueDate":"1984-11-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicVolumeNumber":"25"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"updated":"2025-01-23T00:07:37.828020+00:00","created":"2025-01-18T22:49:18.138090+00:00","id":15873}