{"created":"2025-01-18T22:49:07.965043+00:00","updated":"2025-01-23T00:14:41.222298+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00015639","sets":["581:872:878"]},"path":["878"],"owner":"1","recid":"15639","title":["論理LSI用ディレイ・テスト生成システム"],"pubdate":{"attribute_name":"公開日","attribute_value":"1986-07-15"},"_buckets":{"deposit":"d442d01d-6a8d-4442-b9e9-b5ddd38d2464"},"_deposit":{"id":"15639","pid":{"type":"depid","value":"15639","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"論理LSI用ディレイ・テスト生成システム","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"論理LSI用ディレイ・テスト生成システム"},{"subitem_title":"A Delay Test Generator for Logic LSIs","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"論文","subitem_subject_scheme":"Other"}]},"item_type_id":"2","publish_date":"1986-07-15","item_2_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"（株）日立製作所日立研究所"},{"subitem_text_value":"（株）日立製作所日立研究所"},{"subitem_text_value":"（株）日立製作所神奈川工場"}]},"item_2_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Hitachi Research Laboratory, Hitachi, Ltd","subitem_text_language":"en"},{"subitem_text_value":"Hitachi Research Laboratory, Hitachi, Ltd","subitem_text_language":"en"},{"subitem_text_value":"Kanagawa Works, Hitachi, Ltd","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/15639/files/IPSJ-JNL2707007.pdf"},"date":[{"dateType":"Available","dateValue":"1988-07-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-JNL2707007.pdf","filesize":[{"value":"615.0 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"8"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"05578ade-e824-45e6-9ada-d5fcca492da8","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 1986 by the Information Processing Society of Japan"}]},"item_2_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"林, 照峯"},{"creatorName":"畠山, 一実"},{"creatorName":"森脇, 郁"}],"nameIdentifiers":[{}]}]},"item_2_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Terumine, Hayashi","creatorNameLang":"en"},{"creatorName":"Kazumi, Hatayama","creatorNameLang":"en"},{"creatorName":"Kaoru, Moriwaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_2_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00116647","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_2_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-7764","subitem_source_identifier_type":"ISSN"}]},"item_2_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"スキャン構造を持つ論理LSIを対象とするディレイ・テスト生成システムを開発した.本論文では デイレィ・テスト生成においては縮退故障に対する組合せ回路モデルは不適当であることを示し新しい回路モデルを与える.さらに 14値を用いた経路活性化法に基づくディレイ・テスト生成手法を示す.本手法の特徴は活性化臨界点SCP(Sensitization Critical Point)という新しい概念を導入していること テストの型をセットアップ型とホールド型に分類していることにあり これによってデータ系パスだけでなくクロック系パス上のディレイ故障に対してもディレイ・テスト生成を可能にしている点にある.1500ゲート級のLSI 4ケースに対する実験により ディレイ故障検出率95.9% CPUタイム3.2分(HITAC-M200 H使用)が得られ 本手法が実用的な能力を持つことを確認した.","subitem_description_type":"Other"}]},"item_2_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"713","bibliographic_titles":[{"bibliographic_title":"情報処理学会論文誌"}],"bibliographicPageStart":"707","bibliographicIssueDates":{"bibliographicIssueDate":"1986-07-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7","bibliographicVolumeNumber":"27"}]},"relation_version_is_last":true,"item_2_alternative_title_2":{"attribute_name":"その他タイトル","attribute_value_mlt":[{"subitem_alternative_title":"CAD"}]},"weko_creator_id":"1"},"id":15639,"links":{}}