@techreport{oai:ipsj.ixsq.nii.ac.jp:00146132, author = {伊勢, 幸太郎 and 四柳, 浩之 and 橋爪, 正樹 and 樋上, 喜信 and 高橋, 寛 and Kotaro, Ise and Hiroyuki, Yotuyanagi and Masaki, Hashizume and Yoshinobu, Higami and Hiroshi, Takahashi}, issue = {6}, month = {Nov}, note = {IC 内で発生する半断線故障は抵抗成分を持ち,故障の影響は微小遅延として顕在化する.また,トランジスタのばらつきの影響による遅延変動も存在するため,故障の判別は困難になる.隣接配線を持つ配線の信号遅延は,隣接線での信号遷移の影響を受け,また,その遅延変動は故障の有無によっても異なる.本研究では,複数の入力信号に対する遅延の分布を用いて故障判別を行う手法を検討する.電磁界および回路シミュレータを用いて隣接線を持つ配線レイアウトを作製し,隣接線の信号遷移パターンを変化させた際の正常回路と故障回路におけるそれぞれの遅延量を測定する.その遅延量を特徴量とする異常検知による製造ばらつきの影響下での半断線故障の判別法の有効性について調査を行う., The effect of a resistive open results in small delay in an IC. It is difficult to test small delay since signal delay also varies by parameter variations such as transistor size. Signal delay of a line with adjacent lines is affected by the signal transition of the adjacent lines. Moreover, the delay variation also depends on the existence of a fault. In this study, a discrimination method is proposed that utilizes delay distributions obtained by the various input signals. We examined the circuit delay in a fault-free circuit and a faulty circuit by applying electromagnetic simulator and circuit simulatior for a line layout with adjacent lines. We investigate the effectiveness of the method that discriminates a resistive open using anomaly detection from delays obtained by the simulation.}, title = {隣接線の信号遷移による遅延変動を用いる半断線故障の判別法について}, year = {2015} }