{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00130440","sets":["6504:8117:8120"]},"path":["8120"],"owner":"1","recid":"130440","title":["微分ベクトルに基づくシェイジング領域の抽出"],"pubdate":{"attribute_name":"公開日","attribute_value":"1996-09-04"},"_buckets":{"deposit":"23319135-d5a7-4ce1-9a06-ddccee200970"},"_deposit":{"id":"130440","pid":{"type":"depid","value":"130440","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"微分ベクトルに基づくシェイジング領域の抽出","author_link":[],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"微分ベクトルに基づくシェイジング領域の抽出"},{"subitem_title":"Extracting shading regions based on differential vectors","subitem_title_language":"en"}]},"item_type_id":"22","publish_date":"1996-09-04","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_22_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"スタンレー電気(株)技術研究所"},{"subitem_text_value":"電子技術総合研究所"},{"subitem_text_value":"スタンレー電気(株)技術研究所"},{"subitem_text_value":"電子技術総合研究所"}]},"item_22_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Stanley Electric Co., Ltd. R&D","subitem_text_language":"en"},{"subitem_text_value":"Electrotechnical Laboratory","subitem_text_language":"en"},{"subitem_text_value":"Stanley Electric Co., Ltd. R&D","subitem_text_language":"en"},{"subitem_text_value":"Electrotechnical Laboratory","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/130440/files/KJ00001342200.pdf"},"date":[{"dateType":"Available","dateValue":"1996-09-04"}],"format":"application/pdf","filename":"KJ00001342200.pdf","filesize":[{"value":"218.8 kB"}],"mimetype":"application/pdf","accessrole":"open_date","version_id":"575d69d4-4d6e-4e7f-9db6-5aedcc8bfa0f","displaytype":"detail","licensetype":"license_note"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_22_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00349328","subitem_source_identifier_type":"NCID"}]},"item_22_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"画像を構造的に解析する場合に、画像の性質が同じ領域を抽出する、あるいは、性質が急変するエッジを検出することが必要となる。従来では、画像の性質として画像の明るさ/色の一様性とテクスチャー性にのみ着目していたが、曲面体を対象とする場合には、シェイジングの有無も重要な情報となる。そこで、本報告では、シェイディング領域を微分法により抽出する方法を提案する。本来、微分法は、画像の明るさが急変するステップ状のエッジを、微分値の大きな部分として検出するために利用されているが、微分方向の変化を調べることにより、画像の明るさが緩やかに変化するシェイジング領域の抽出もできることを示す。","subitem_description_type":"Other"}]},"item_22_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"328","bibliographic_titles":[{"bibliographic_title":"全国大会講演論文集"}],"bibliographicPageStart":"327","bibliographicIssueDates":{"bibliographicIssueDate":"1996-09-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"人工知能と認知科学","bibliographicVolumeNumber":"第53回"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":130440,"updated":"2025-01-21T00:08:24.468484+00:00","links":{},"created":"2025-01-19T00:09:30.394028+00:00"}