{"links":{},"id":127930,"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00127930","sets":["6504:8078:8086"]},"path":["8086"],"owner":"1","recid":"127930","title":["バグデータ分析によるソフトウェア品質向上手法"],"pubdate":{"attribute_name":"公開日","attribute_value":"1995-03-15"},"_buckets":{"deposit":"897703ae-70af-455a-9351-c7823b3bff4f"},"_deposit":{"id":"127930","pid":{"type":"depid","value":"127930","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"バグデータ分析によるソフトウェア品質向上手法","author_link":[],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"バグデータ分析によるソフトウェア品質向上手法"},{"subitem_title":"Software Quality Improvement Using \"Function-Bug Matrix\"","subitem_title_language":"en"}]},"item_type_id":"22","publish_date":"1995-03-15","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_22_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"オムロン(株)FA統轄事業部コントローラ研究所"},{"subitem_text_value":"オムロン(株)FA統轄事業部コントローラ研究所"},{"subitem_text_value":"オムロン(株)FA統轄事業部コントローラ研究所"}]},"item_22_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"OMRON Co., Intelligent Controller Lab., FA Division H.Q.","subitem_text_language":"en"},{"subitem_text_value":"OMRON Co., Intelligent Controller Lab., FA Division H.Q.","subitem_text_language":"en"},{"subitem_text_value":"OMRON Co., Intelligent Controller Lab., FA Division H.Q.","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/127930/files/KJ00001334326.pdf"},"date":[{"dateType":"Available","dateValue":"1995-03-15"}],"format":"application/pdf","filename":"KJ00001334326.pdf","filesize":[{"value":"124.1 kB"}],"mimetype":"application/pdf","accessrole":"open_date","version_id":"fa6251cd-b62d-47af-808f-ef08ebe002be","displaytype":"detail","licensetype":"license_note"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_22_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00349328","subitem_source_identifier_type":"NCID"}]},"item_22_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ソフトウェアの品質メジャーとして信頼度成長曲線がよく用いられている。しかし、信頼度成長曲線を用いるための前提条件を満足するようなソフトウェアは稀である。そのため、・信頼度成長曲線を収束させるために不必要な試験を数多く行なわなければならない・信頼度成長曲線は収束したけれども信頼性に不安が残るなどのような問題点がある。今回、信頼度成長曲線を補完するため、試験項目の充実を目的としてバグデータの分析を行なった結果を発表する。テスト時に採ったバグデータをマトリクス状に表して分析し、試験項目の不十分なところを見つけ出し、再テストを行なうことでソフトウェアの信頼性を向上させた。","subitem_description_type":"Other"}]},"item_22_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"238","bibliographic_titles":[{"bibliographic_title":"全国大会講演論文集"}],"bibliographicPageStart":"237","bibliographicIssueDates":{"bibliographicIssueDate":"1995-03-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"ソフトウェア工学","bibliographicVolumeNumber":"第50回"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"created":"2025-01-19T00:07:22.078367+00:00","updated":"2025-01-21T01:08:53.144696+00:00"}