{"created":"2025-01-19T00:03:53.691011+00:00","updated":"2025-01-21T02:46:36.911811+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00123880","sets":["6504:8032:8041"]},"path":["8041"],"owner":"1","recid":"123880","title":["テストケース自動生成ツール「Mirage」による1チップCPUプロセッサの機能検証"],"pubdate":{"attribute_name":"公開日","attribute_value":"1993-03-01"},"_buckets":{"deposit":"6517acd6-336c-4a1d-b943-93979850045c"},"_deposit":{"id":"123880","pid":{"type":"depid","value":"123880","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"テストケース自動生成ツール「Mirage」による1チップCPUプロセッサの機能検証","author_link":[],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"テストケース自動生成ツール「Mirage」による1チップCPUプロセッサの機能検証"},{"subitem_title":"Design Verification or One-Chip CPU Proccssor Using Automatic Test-case Generator 'Mirage'","subitem_title_language":"en"}]},"item_type_id":"22","publish_date":"1993-03-01","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_22_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"三菱電機(株)"},{"subitem_text_value":"三菱電機(株)"},{"subitem_text_value":"三菱電機(株)"},{"subitem_text_value":"三菱電機(株)"},{"subitem_text_value":"三菱電機エンジニアリング(株)"}]},"item_22_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Mitsubishi Electric Corp.","subitem_text_language":"en"},{"subitem_text_value":"Mitsubishi Electric Corp.","subitem_text_language":"en"},{"subitem_text_value":"Mitsubishi Electric Corp.","subitem_text_language":"en"},{"subitem_text_value":"Mitsubishi Electric Corp.","subitem_text_language":"en"},{"subitem_text_value":"Mitsubishi Electric Engineering Co.,Ltd.","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/123880/files/KJ00001337727.pdf"},"date":[{"dateType":"Available","dateValue":"1993-03-01"}],"format":"application/pdf","filename":"KJ00001337727.pdf","filesize":[{"value":"152.4 kB"}],"mimetype":"application/pdf","accessrole":"open_date","version_id":"3a6bb0dd-7b61-4693-844f-bf4edd6962bc","displaytype":"detail","licensetype":"license_note"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_22_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00349328","subitem_source_identifier_type":"NCID"}]},"item_22_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ビジネスコンピュータ用の1チップCPUプロセッサ(170万Tr)を開発した。LSIの設計品質向上のため設計段階で、外部仕様や内部仕様に基づくテストに加えて、ランダムな命令シーケンスによって個々のテスト項目を競合させるランダムテストを行ない、機能検証を実施した。本稿では、テストケース自動生成ツール「Mirage」を用いたランダムテストの概要について報告する。","subitem_description_type":"Other"}]},"item_22_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"148","bibliographic_titles":[{"bibliographic_title":"全国大会講演論文集"}],"bibliographicPageStart":"147","bibliographicIssueDates":{"bibliographicIssueDate":"1993-03-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"ハードウェア","bibliographicVolumeNumber":"第46回"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":123880,"links":{}}