{"updated":"2025-01-21T02:50:14.203939+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00123732","sets":["6504:8032:8040"]},"path":["8040"],"owner":"1","recid":"123732","title":["PB曲線による品質予測手法"],"pubdate":{"attribute_name":"公開日","attribute_value":"1993-03-01"},"_buckets":{"deposit":"e4c1f499-b3d6-4be2-8371-65dc54d133d2"},"_deposit":{"id":"123732","pid":{"type":"depid","value":"123732","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"PB曲線による品質予測手法","author_link":[],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"PB曲線による品質予測手法"},{"subitem_title":"A Method of Quality Prediction by the PB Curves","subitem_title_language":"en"}]},"item_type_id":"22","publish_date":"1993-03-01","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_22_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"三菱電機関西コンピュータシステム(株)"}]},"item_22_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Mitsubishi Electric Computer Systems (Kansai) Co.ltd","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/123732/files/KJ00001337574.pdf"},"date":[{"dateType":"Available","dateValue":"1993-03-01"}],"format":"application/pdf","filename":"KJ00001337574.pdf","filesize":[{"value":"103.1 kB"}],"mimetype":"application/pdf","accessrole":"open_date","version_id":"1be8d6f6-281d-4c1b-b562-140f76573200","displaytype":"detail","licensetype":"license_note"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_22_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00349328","subitem_source_identifier_type":"NCID"}]},"item_22_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年ソフトウェアは大規模、複雑化しており、ソフトウェア開発において、工程遅れ、原価オーバー、品質の悪化等によるプロジェクト崩れが後を絶たない.このプロジェクト崩れの予測、防止を行うことは、今日のソフトウェア業界にとっては最重要課題である.ソフトウェア開発を、設計段階、製作段階、試験段階と三段階に分けた場合、プロジェクト崩れが判明するのは試験段階であり、この試験期間中に品質予測を行うことにより、プロジェクト崩れを予測、防止することが可能である.そこで、試験段階における試験項目数、障害件数、作業日の関係を示すPCL(プログラム・チェックリスト)消化・バグ検出曲線図(以降PB曲線と略す)による分析および、試験期間の途中段階での品質予測手法について述べる.","subitem_description_type":"Other"}]},"item_22_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"198","bibliographic_titles":[{"bibliographic_title":"全国大会講演論文集"}],"bibliographicPageStart":"197","bibliographicIssueDates":{"bibliographicIssueDate":"1993-03-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"ソフトウェア工学","bibliographicVolumeNumber":"第46回"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"created":"2025-01-19T00:03:46.182110+00:00","id":123732,"links":{}}