{"created":"2025-01-18T22:46:30.166974+00:00","updated":"2025-01-23T01:53:04.418192+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00012036","sets":["581:677:686"]},"path":["686"],"owner":"1","recid":"12036","title":["故障検出困難度を利用したコンパクトなIDDQテスト集合生成法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2001-04-15"},"_buckets":{"deposit":"f25decc9-c26d-4cec-ab4a-0227d7dc0fbf"},"_deposit":{"id":"12036","pid":{"type":"depid","value":"12036","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"故障検出困難度を利用したコンパクトなIDDQテスト集合生成法","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"故障検出困難度を利用したコンパクトなIDDQテスト集合生成法"},{"subitem_title":"A Compact IDDQ Test Set Generation Method Using Hard-to-detect Measure","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"特集：システムLSIの設計技術と設計自動化","subitem_subject_scheme":"Other"}]},"item_type_id":"2","publish_date":"2001-04-15","item_2_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"三重大学大学院工学研究科"},{"subitem_text_value":"三重大学大学院工学研究科"},{"subitem_text_value":"三重大学大学院工学研究科"}]},"item_2_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Engineering, Mie University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Engineering, Mie University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Engineering, Mie University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/12036/files/IPSJ-JNL4204042.pdf"},"date":[{"dateType":"Available","dateValue":"2003-04-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-JNL4204042.pdf","filesize":[{"value":"541.9 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"8"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"a7564647-d1b2-47d8-bf46-cfb535dd539e","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2001 by the Information Processing Society of Japan"}]},"item_2_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"渡邉, 猛夫"},{"creatorName":"篠木, 剛"},{"creatorName":"林, 照峯"}],"nameIdentifiers":[{}]}]},"item_2_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Isao, Watanabe","creatorNameLang":"en"},{"creatorName":"Tsuyoshi, Shinogi","creatorNameLang":"en"},{"creatorName":"Terumine, Hayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_2_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00116647","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_2_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-7764","subitem_source_identifier_type":"ISSN"}]},"item_2_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"本論文は，IDDQテスト法を用いてブリッジ故障を検出するための，コンパクトなテストパターン集合を生成する手法について述べる．すでに提案されている乱数逐次改善法を用いたgreedy生成法cite{ref5 ref6}では，検出が容易な故障から優先して検出するテストパターンが生成されていくという性質があるが，新手法では，それとは反対に，できるだけ検出が困難な故障から優先して検出されるようにテストパターンを生成することによって，テストパターン数がより少ないIDDQテスト集合を生成する．評価実験結果により有効性を示す．","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"This paper presents a generation method of compact IDDQ test setsfor detecting bridging faults. In the previously proposed method(a greedy method using iterative improvement ofrandom patterns cite{ref5,ref6}),easy-to-detect faults tend to be detected by the patterns generatedearlier in the test set.On the contrary, in the new method proposed in this paper,hard-to-detect faults are detected bythe patterns generated earlier in the test set,which leads to decrease the number of test patterns.The experimental results demonstrate its effectiveness.","subitem_description_type":"Other"}]},"item_2_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"1035","bibliographic_titles":[{"bibliographic_title":"情報処理学会論文誌"}],"bibliographicPageStart":"1030","bibliographicIssueDates":{"bibliographicIssueDate":"2001-04-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicVolumeNumber":"42"}]},"relation_version_is_last":true,"item_2_alternative_title_2":{"attribute_name":"その他タイトル","attribute_value_mlt":[{"subitem_alternative_title":"テスト設計"}]},"weko_creator_id":"1"},"id":12036,"links":{}}