{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00116705","sets":["6504:7950:7957"]},"path":["7957"],"owner":"1","recid":"116705","title":["ソフトウェア信頼度成長モデルの適用に関する一考察"],"pubdate":{"attribute_name":"公開日","attribute_value":"1989-03-15"},"_buckets":{"deposit":"2af39314-4260-4a0a-b181-44b96a12794c"},"_deposit":{"id":"116705","pid":{"type":"depid","value":"116705","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"ソフトウェア信頼度成長モデルの適用に関する一考察","author_link":[],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ソフトウェア信頼度成長モデルの適用に関する一考察"},{"subitem_title":"On the software reliability growth models","subitem_title_language":"en"}]},"item_type_id":"22","publish_date":"1989-03-15","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_22_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京理科大学工学研究科"},{"subitem_text_value":"東京理科大学工学研究科"}]},"item_22_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Faculty of Engineering, Sicence University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Faculty of Engineering, Sicence University of Tokyo","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/116705/files/KJ00001333449.pdf"},"date":[{"dateType":"Available","dateValue":"1989-03-15"}],"format":"application/pdf","filename":"KJ00001333449.pdf","filesize":[{"value":"116.7 kB"}],"mimetype":"application/pdf","accessrole":"open_date","version_id":"c0ad5bc2-92a3-4ff8-a658-9338994a39b9","displaytype":"detail","licensetype":"license_note"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_22_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00349328","subitem_source_identifier_type":"NCID"}]},"item_22_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"システムの信頼性向上のためには,ハードウェアとソフトウェアの両面から信頼性の向上を図る必要がある.ハードウェアは,信頼性の向上と大幅なコストの低減が図られてきたが,ソフトウェアは様々な面で立ち遅れている.そこで,ソフトウェアをライフサイクル全体でとらえ,高品質のソフトウェアを効率良く実現することが重要視されている.そのためには,ソフトウェア開発段階における有効な技術の開発と同時に,ソフトウェア信頼性の評価方法に関する研究が進められている.その一つに,テスト工程でバグによって引き起こされるソフトウェア故障の時系列現象の側面から,ソフトウェア信頼性をとらえるソフトウェア信頼度成長モデルがある.しかし,このモデルを適用する場合,いくつかの問題点がある.","subitem_description_type":"Other"}]},"item_22_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"1250","bibliographic_titles":[{"bibliographic_title":"全国大会講演論文集"}],"bibliographicPageStart":"1249","bibliographicIssueDates":{"bibliographicIssueDate":"1989-03-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"ソフトウェア工学","bibliographicVolumeNumber":"第38回"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":116705,"updated":"2025-01-21T05:38:59.315248+00:00","links":{},"created":"2025-01-18T23:57:45.669099+00:00"}