{"updated":"2025-01-21T10:21:43.644680+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00104360","sets":["6504:7684:7685"]},"path":["7685"],"owner":"6748","recid":"104360","title":["直交表とオールペア法のテスト回数と網羅率について"],"pubdate":{"attribute_name":"公開日","attribute_value":"2014-03-11"},"_buckets":{"deposit":"0ae530af-a7a5-42b0-a73c-1593aeec1e2f"},"_deposit":{"id":"104360","pid":{"type":"depid","value":"104360","revision_id":0},"owners":[6748],"status":"published","created_by":6748},"item_title":"直交表とオールペア法のテスト回数と網羅率について","author_link":["4375","4374"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"直交表とオールペア法のテスト回数と網羅率について"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ソフトウェア科学・工学","subitem_subject_scheme":"Other"}]},"item_type_id":"22","publish_date":"2014-03-11","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_22_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"群馬高専"},{"subitem_text_value":"沖電気"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/104360/files/IPSJ-Z76-6A-4.pdf"},"date":[{"dateType":"Available","dateValue":"2014-10-02"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-Z76-6A-4.pdf","filesize":[{"value":"135.6 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"3c6f4d14-5937-4df6-9f95-5bc811282b32","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2014 by the Information Processing Society of Japan"}]},"item_22_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"須田健二"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"五味弘"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_22_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00349328","subitem_source_identifier_type":"NCID"}]},"item_22_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"組合せテストの品質を保ち、かつテスト回数を少なくするためのテスト技法として直交表とオールペア法（被覆表）が知られている。しかし今まではその生成ツールの使いやすさやテスト回数が少ないなどの理由からオールペア法の方がより多く利用されてきた。また、組合せの個数を 2個に固定するなど限定的な使用が多かった。そこで我々が開発している万能型直交表生成ソフトGaloisと代表的なオールペア法の生成ソフトであるPICTに対して、因子数やその水準数、強さが与えられた時のテスト回数と網羅率を求めた。そして、それらを比較検討することにより，テスト対象のソフトウェアにより適した技法として、直交表とオールペア法のどちらを選択するべきかの指針を与える。","subitem_description_type":"Other"}]},"item_22_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"240","bibliographic_titles":[{"bibliographic_title":"第76回全国大会講演論文集"}],"bibliographicPageStart":"239","bibliographicIssueDates":{"bibliographicIssueDate":"2014-03-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicVolumeNumber":"2014"}]},"relation_version_is_last":true,"weko_creator_id":"6748"},"created":"2025-01-18T23:48:25.617592+00:00","id":104360,"links":{}}