2026-05-19T22:54:46Z https://ipsj.ixsq.nii.ac.jp/oai

oai:ipsj.ixsq.nii.ac.jp:00184005 2025-01-20T03:26:13Z 1164:2822:9120:9274

On Avoiding Test Data Corruption by Optimal Scan Chain Grouping On Avoiding Test Data Corruption by Optimal Scan Chain Grouping Yucong, Zhang Stefan, Holst Xiaoqing, Wen Kohei, Miyase Seiji, Kajihara Jun, Qian Yucong, Zhang Stefan, Holst Xiaoqing, Wen Kohei, Miyase Seiji, Kajihara Jun, Qian Scan shift operations cause many gates to switch simultaneously. As a result, excessive IR-drop may occur, disrupting the states of some scan flip-flops and thus corrupting test stimuli or test responses. A widely-adopted approach to solving this problem is to design multiple scan chains and shift only a group of of them at a time. This paper presents a novel scan chain grouping algorithm for reducing the probability of test data corruption caused by excessive instantaneous IR-drop on scan flip-flops. Experimental results show significant improvement of shift-power safety on all large ITC' 99 benchmark circuits. Scan shift operations cause many gates to switch simultaneously. As a result, excessive IR-drop may occur, disrupting the states of some scan flip-flops and thus corrupting test stimuli or test responses. A widely-adopted approach to solving this problem is to design multiple scan chains and shift only a group of of them at a time. This paper presents a novel scan chain grouping algorithm for reducing the probability of test data corruption caused by excessive instantaneous IR-drop on scan flip-flops. Experimental results show significant improvement of shift-power safety on all large ITC' 99 benchmark circuits. 情報処理学会 2017-10-30 eng technical report https://ipsj.ixsq.nii.ac.jp/records/184005 2188-868X AA12149313 研究報告組込みシステム（EMB） 2017-EMB-46 17 1 4 https://ipsj.ixsq.nii.ac.jp/record/184005/files/IPSJ-EMB17046017.pdf application/pdf 366.9 kB