Achieving Effective Fault Tolerance in FU array by Adding AVF Awareness

• Item type: SIG Technical Reports(1)
• 公開日: 2012-03-20
• タイトル: Achieving Effective Fault Tolerance in FU array by Adding AVF Awareness
• タイトル / 言語: en
• タイトル: Achieving Effective Fault Tolerance in FU array by Adding AVF Awareness
• 言語: eng
• キーワード / 主題Scheme: Other
• キーワード / 主題: 信頼性
• 資源タイプ / 資源タイプ識別子: http://purl.org/coar/resource_type/c_18gh
• 資源タイプ: technical report
• 著者所属: Nara Institute of Science & Technology
• 著者所属: Nara Institute of Science & Technology
• 著者所属: Nara Institute of Science & Technology
• 著者所属(英): en
• 著者所属(英): Nara Institute of Science & Technology
• 著者所属(英): en
• 著者所属(英): Nara Institute of Science & Technology
• 著者所属(英): en
• 著者所属(英): Nara Institute of Science & Technology
• 著者名: Tanvir, Ahmed; Jun, Yao; Yasuhiko, Nakashima
• 著者名(英): Tanvir, Ahmed; Jun, Yao; Yasuhiko, Nakashima
• 論文抄録 / 内容記述タイプ: Other
• 論文抄録 / 内容記述: Fault-tolerance now plays an important role to cover the increasing soft/hard error rates in electronic devices along the advances of process technologies. Error detection with negligible performance impedance and low hardware overhead is accordingly a main concern to keep efficient high dependability. In this paper, a fault-tolerable FU array is proposed with the awareness of architectural vulnerable factor (AVFs). Specifically, we designed a method to help fast locate the erroneous execution in FU array by effectively checking the most vulnerable branches of the data path. It can be further applied to detect multi-site faults or to reduce less important redundancy.
• 論文抄録(英) / 内容記述タイプ: Other
• 論文抄録(英) / 内容記述: Fault-tolerance now plays an important role to cover the increasing soft/hard error rates in electronic devices along the advances of process technologies. Error detection with negligible performance impedance and low hardware overhead is accordingly a main concern to keep efficient high dependability. In this paper, a fault-tolerable FU array is proposed with the awareness of architectural vulnerable factor (AVFs). Specifically, we designed a method to help fast locate the erroneous execution in FU array by effectively checking the most vulnerable branches of the data path. It can be further applied to detect multi-site faults or to reduce less important redundancy.
• 書誌レコードID / 収録物識別子タイプ: NCID
• 書誌レコードID / 収録物識別子: AN10096105
• 書誌情報: 研究報告計算機アーキテクチャ（ARC）; 巻 2012-ARC-199, 号 5, p. 1-4, 発行日 2012-03-20
• Notice: SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc.
• 出版者 / 言語: ja
• 出版者: 情報処理学会