Scan Vulnerability in Elliptic Curve Cryptosystems

• Item type: Trans(1)
• 公開日: 2011-02-08
• タイトル: Scan Vulnerability in Elliptic Curve Cryptosystems
• タイトル / 言語: en
• タイトル: Scan Vulnerability in Elliptic Curve Cryptosystems
• 言語: eng
• キーワード / 主題Scheme: Other
• キーワード / 主題: Circuit-Level Security Analysis
• 資源タイプ / 資源タイプ識別子: http://purl.org/coar/resource_type/c_6501
• 資源タイプ: journal article
• 著者所属: Department of Computer Science and Engineering, Waseda University
• 著者所属: Department of Computer Science and Engineering, Waseda University
• 著者所属: Department of Electronic and Photonic Systems, Waseda University
• 著者所属: Department of Computer Science and Engineering, Waseda University
• 著者所属(英): en
• 著者所属(英): Department of Computer Science and Engineering, Waseda University
• 著者所属(英): en
• 著者所属(英): Department of Computer Science and Engineering, Waseda University
• 著者所属(英): en
• 著者所属(英): Department of Electronic and Photonic Systems, Waseda University
• 著者所属(英): en
• 著者所属(英): Department of Computer Science and Engineering, Waseda University
• 著者名: Ryuta, Nara; Nozomu, Togawa; Masao, Yanagisawa; Tatsuo, Ohtsuki
• 著者名(英): Ryuta, Nara; Nozomu, Togawa; Masao, Yanagisawa; Tatsuo, Ohtsuki
• 論文抄録 / 内容記述タイプ: Other
• 論文抄録 / 内容記述: A scan-path test is one of the most important testing techniques, but it can be used as a side-channel attack against a cryptography circuit. Scan-based attacks are techniques to decipher a secret key using scanned data obtained from a cryptography circuit. Public-key cryptography, such as RSA and elliptic curve cryptosystem (ECC), is extensively used but conventional scan-based attacks cannot be applied to it, because it has a complicated algorithm as well as a complicated architecture. This paper proposes a scan-based attack which enables us to decipher a secret key in ECC. The proposed method is based on detecting intermediate values calculated in ECC. We focus on a 1-bit sequence which is specific to some intermediate values. By monitoring the 1-bit sequence in the scan path, we can find out the register position specific to the intermediate value in it and we can know whether this intermediate value is calculated or not in the target ECC circuit. By using several intermediate values, we can decipher a secret key. The experimental results demonstrate that a secret key in a practical ECC circuit can be deciphered using 29 points over the elliptic curve E within 40 seconds.
• 論文抄録(英) / 内容記述タイプ: Other
• 論文抄録(英) / 内容記述: A scan-path test is one of the most important testing techniques, but it can be used as a side-channel attack against a cryptography circuit. Scan-based attacks are techniques to decipher a secret key using scanned data obtained from a cryptography circuit. Public-key cryptography, such as RSA and elliptic curve cryptosystem (ECC), is extensively used but conventional scan-based attacks cannot be applied to it, because it has a complicated algorithm as well as a complicated architecture. This paper proposes a scan-based attack which enables us to decipher a secret key in ECC. The proposed method is based on detecting intermediate values calculated in ECC. We focus on a 1-bit sequence which is specific to some intermediate values. By monitoring the 1-bit sequence in the scan path, we can find out the register position specific to the intermediate value in it and we can know whether this intermediate value is calculated or not in the target ECC circuit. By using several intermediate values, we can decipher a secret key. The experimental results demonstrate that a secret key in a practical ECC circuit can be deciphered using 29 points over the elliptic curve E within 40 seconds.
• 書誌レコードID / 収録物識別子タイプ: NCID
• 書誌レコードID / 収録物識別子: AA12394951
• 書誌情報: IPSJ Transactions on System LSI Design Methodology（TSLDM）; 巻 4, p. 47-59, 発行日 2011-02-08
• ISSN / 収録物識別子タイプ: ISSN
• ISSN / 収録物識別子: 1882-6687
• 出版者 / 言語: ja
• 出版者: 情報処理学会