On Avoiding Test Data Corruption by Optimal Scan Chain Grouping

• Item type: SIG Technical Reports(1)
• 公開日: 2017-10-30
• タイトル: On Avoiding Test Data Corruption by Optimal Scan Chain Grouping
• タイトル / 言語: en
• タイトル: On Avoiding Test Data Corruption by Optimal Scan Chain Grouping
• 言語: eng
• キーワード / 主題Scheme: Other
• キーワード / 主題: テスト生成およびテスト容易化設計
• 資源タイプ / 資源タイプ識別子: http://purl.org/coar/resource_type/c_18gh
• 資源タイプ: technical report
• 著者所属: Kyushu Institute of Technology
• 著者所属: Kyushu Institute of Technology
• 著者所属: Kyushu Institute of Technology
• 著者所属: Kyushu Institute of Technology
• 著者所属: Kyushu Institute of Technology
• 著者所属: Advanced Micro Devices, Inc.
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Kyushu Institute of Technology
• 著者所属(英): en
• 著者所属(英): Advanced Micro Devices, Inc.
• 著者名: Yucong, Zhang; Stefan, Holst; Xiaoqing, Wen; Kohei, Miyase; Seiji, Kajihara; Jun, Qian
• 著者名(英): Yucong, Zhang; Stefan, Holst; Xiaoqing, Wen; Kohei, Miyase; Seiji, Kajihara; Jun, Qian
• 論文抄録 / 内容記述タイプ: Other
• 論文抄録 / 内容記述: Scan shift operations cause many gates to switch simultaneously. As a result, excessive IR-drop may occur, disrupting the states of some scan flip-flops and thus corrupting test stimuli or test responses. A widely-adopted approach to solving this problem is to design multiple scan chains and shift only a group of of them at a time. This paper presents a novel scan chain grouping algorithm for reducing the probability of test data corruption caused by excessive instantaneous IR-drop on scan flip-flops. Experimental results show significant improvement of shift-power safety on all large ITC' 99 benchmark circuits.
• 論文抄録(英) / 内容記述タイプ: Other
• 論文抄録(英) / 内容記述: Scan shift operations cause many gates to switch simultaneously. As a result, excessive IR-drop may occur, disrupting the states of some scan flip-flops and thus corrupting test stimuli or test responses. A widely-adopted approach to solving this problem is to design multiple scan chains and shift only a group of of them at a time. This paper presents a novel scan chain grouping algorithm for reducing the probability of test data corruption caused by excessive instantaneous IR-drop on scan flip-flops. Experimental results show significant improvement of shift-power safety on all large ITC' 99 benchmark circuits.
• 書誌レコードID / 収録物識別子タイプ: NCID
• 書誌レコードID / 収録物識別子: AA11451459
• 書誌情報: 研究報告システムとLSIの設計技術（SLDM）; 巻 2017-SLDM-181, 号 17, p. 1-4, 発行日 2017-10-30
• ISSN / 収録物識別子タイプ: ISSN
• ISSN / 収録物識別子: 2188-8639
• Notice: SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc.
• 出版者 / 言語: ja
• 出版者: 情報処理学会