| Item type |
SIG Technical Reports(1) |
| 公開日 |
2015-05-07 |
| タイトル |
|
|
タイトル |
Trace Signal Selection Methods for Post Silicon Debugging |
| タイトル |
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言語 |
en |
|
タイトル |
Trace Signal Selection Methods for Post Silicon Debugging |
| 言語 |
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言語 |
eng |
| キーワード |
|
|
主題Scheme |
Other |
|
主題 |
回路設計・実装 |
| 資源タイプ |
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資源タイプ識別子 |
http://purl.org/coar/resource_type/c_18gh |
|
資源タイプ |
technical report |
| 著者所属 |
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Dept. of Electrical Engineering and Information Systems, The University of Tokyo |
| 著者所属 |
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Dept. of Electrical Engineering and Information Systems, The University of Tokyo |
| 著者所属 |
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Ishikawa National College of Technology |
| 著者所属 |
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VLSI Design and Education Center, The University of Tokyo |
| 著者所属(英) |
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en |
|
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Dept. of Electrical Engineering and Information Systems, The University of Tokyo |
| 著者所属(英) |
|
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|
en |
|
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Dept. of Electrical Engineering and Information Systems, The University of Tokyo |
| 著者所属(英) |
|
|
|
en |
|
|
Ishikawa National College of Technology |
| 著者所属(英) |
|
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|
en |
|
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VLSI Design and Education Center, The University of Tokyo |
| 著者名 |
Shridhar, Chaudhary
Amir Masoud, Gharehbaghi
Takeshi, Matsumoto
Masahiro, Fujita
|
| 著者名(英) |
Shridhar, Chaudhar
Amir Masoud, Gharehbaghi
Takeshi, Matsumoto
Masahiro, Fujita
|
| 論文抄録 |
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内容記述タイプ |
Other |
|
内容記述 |
In post-silicon debugging, only a limited number of states (flip-flops) can be traced, due to the area overhead that is introduced by trace buffers. Therefore, it is important to select the states which can restore most of the other states. There exist researches that try to heuristically select a set of flip-flops (FFs) which maximizes the number of restored FFs. Those existing works are not so robust and the cost functions used for selections do not work well in some cases. In this paper, we introduce a hardware based implementation which tries to improve selection by repeatedly swapping the flip-flops to be traced. As this is faster than software by 3-4 orders of magnitude, we can swap much more times and get consistent results even for large circuits. |
| 論文抄録(英) |
|
|
内容記述タイプ |
Other |
|
内容記述 |
In post-silicon debugging, only a limited number of states (flip-flops) can be traced, due to the area overhead that is introduced by trace buffers. Therefore, it is important to select the states which can restore most of the other states. There exist researches that try to heuristically select a set of flip-flops (FFs) which maximizes the number of restored FFs. Those existing works are not so robust and the cost functions used for selections do not work well in some cases. In this paper, we introduce a hardware based implementation which tries to improve selection by repeatedly swapping the flip-flops to be traced. As this is faster than software by 3-4 orders of magnitude, we can swap much more times and get consistent results even for large circuits. |
| 書誌レコードID |
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収録物識別子タイプ |
NCID |
|
収録物識別子 |
AA11451459 |
| 書誌情報 |
研究報告システムとLSIの設計技術（SLDM）
巻 2015-SLDM-171,
号 4,
p. 1-6,
発行日 2015-05-07
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| ISSN |
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収録物識別子タイプ |
ISSN |
|
収録物識別子 |
2188-8639 |
| Notice |
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SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc. |
| 出版者 |
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言語 |
ja |
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出版者 |
情報処理学会 |
IPSJ-SLDM15171004 (863.1 kB)
