@article{weko_77264_1,
   author	 = "Seiji,Kajihara and Satoshi,Ohtake and Tomokazu,Yoneda",
   title	 = "Delay Testing: Improving Test Quality and Avoiding Over-testing",
   journal	 = "IPSJ Transactions on System LSI Design Methodology（TSLDM）",
   year 	 = "2011",
   volume	 = "4",
   number	 = "",
   pages	 = "117--130",
   month	 = "aug"
}