@techreport{weko_66849_1,
   author	 = "Kaku,Tabei and Toshinori,Yamada",
   title	 = "On Generating Test Sets for Detecting Stuck-at Faults in Reversible Circuits",
   year 	 = "2009",
   institution	 = "Division of Mathematics, Electronics and Informatics, Graduate School of Science and Engineering, Saitama University, Division of Mathematics, Electronics and Informatics, Graduate School of Science and Engineering, Saitama University",
   number	 = "2",
   month	 = "nov"
}