@techreport{weko_31662_1,
   author	 = "Satoshi,Tayu and Shigeru,Ito and Shuichi,Ueno",
   title	 = "On the Fault Testing for Reversible Circuits",
   year 	 = "2007",
   institution	 = "Department of Communications and Integrated Systems Tokyo Institute of Technology, Department of Communications and Integrated Systems Tokyo Institute of Technology, Department of Communications and Integrated Systems Tokyo Institute of Technology",
   number	 = "66(2007-AL-113)",
   month	 = "jul"
}