@techreport{weko_28289_1,
   author	 = "吉田,正昭",
   title	 = "CMOS回路に適したBIST用テストパターン発生器",
   year 	 = "1989",
   institution	 = "日本電気（株）C＆Cシステム研究所",
   number	 = "90(1989-SLDM-049)",
   month	 = "oct"
}