@techreport{weko_27112_1,
   author	 = "Tsuyoshi,IWAGAKI and Satoshi,OHTAKE and Hideo,FUJIWARA",
   title	 = "A Broadside Test Generation Method for Transition Faults in Partial Scan Circuits",
   year 	 = "2005",
   institution	 = "School of Information Science Japan Advanced Institute of Science and Technology, Graduate School of Information Science Nara Institute of Science and Technology, Graduate School of Information Science Nara Institute of Science and Technology",
   number	 = "121(2005-SLDM-122)",
   month	 = "nov"
}