@article{weko_18628_1,
   author	 = "Kentaroh,Katoh and Kazuteru,Namba and Hideo,Ito",
   title	 = "Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability",
   journal	 = "IPSJ Transactions on System LSI Design Methodology （TSLDM）",
   year 	 = "2008",
   volume	 = "1",
   number	 = "",
   pages	 = "91--103",
   month	 = "aug"
}